Crack tip dislocations observed by electron tomotraphy in single crystal silicon

Masaki Tanaka, Kenji Higashida, Sunao Sadamatsu, Hiroto Nakamura

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of the 31st Risø International Symposium on Materials Science
Pages	443-448
Number of pages	6
Publication status	Published - 2010

Cite this

@inproceedings{0fedb71e265747629e1512e50c917c71,

title = "Crack tip dislocations observed by electron tomotraphy in single crystal silicon",

author = "Masaki Tanaka and Kenji Higashida and Sunao Sadamatsu and Hiroto Nakamura",

year = "2010",

language = "English",

pages = "443--448",

booktitle = "Proceedings of the 31st Ris{\o} International Symposium on Materials Science",

}