Crack Tip dislocations Observed by High-Voltage Electron-Microscopy in Single Crystal Silicon

Kenji Higashida, Masaki Tanaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication Proceedings of 16th International Microscopy Congress, Publication committee of IMC16
Pages1110
Number of pages1
Publication statusPublished - 2006

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