Crack tip dislocations revealed by electron tomography in silicon single crystal

Research output: Contribution to journalArticlepeer-review

66 Citations (Scopus)

Abstract

Crack tip dislocations in silicon single crystals have been observed by a combination of annular dark-field scanning transmission electron microscopy and computed tomography. A series of images was acquired by maintaining the diffraction vector parallel to that of crack propagation to achieve sharp images of the dislocations. The observed dislocations were reconstructed by a filtered back-projection, and exhibited three-dimensional configurations of overlaid dislocations around the crack tip.

Original languageEnglish
Pages (from-to)901-904
Number of pages4
JournalScripta Materialia
Volume59
Issue number8
DOIs
Publication statusPublished - Oct 2008

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

Fingerprint Dive into the research topics of 'Crack tip dislocations revealed by electron tomography in silicon single crystal'. Together they form a unique fingerprint.

Cite this