Crack tip shielding observed with high-resolution transmission electron microscopy

Damar Rastri Adhika, Masaki Tanaka, Takeshi Daio, Kenji Higashida

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The dislocation shielding field at a crack tip was experimentally proven at the atomic scale by measuring the local strain in front of the crack tip using high-resolution transmission electron microscopy (HRTEM) and geometric phase analysis (GPA). Single crystalline (110) silicon wafers were employed. Cracks were introduced using a Vickers indenter at room temperature. The crack tip region was observed using HRTEM followed by strain measurements using GPA. The measured strain field at the crack tip was compressive owing to dislocation shielding, which is in good agreement with the strain field calculated from elastic theory.

Original languageEnglish
Pages (from-to)335-340
Number of pages6
JournalMicroscopy
Volume64
Issue number5
DOIs
Publication statusPublished - Oct 2015

All Science Journal Classification (ASJC) codes

  • Structural Biology
  • Instrumentation
  • Radiology Nuclear Medicine and imaging

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