Critical charge dependence of correlation of different neutron sources for soft error testing

Hiroko Mori; Taiki Uemura; Hideya Matsuyama; Shin Ichiro Abe; Yukinobu Watanabe

doi:10.1109/IRPS.2015.7112678

Critical charge dependence of correlation of different neutron sources for soft error testing

Hiroko Mori, Taiki Uemura, Hideya Matsuyama, Shin Ichiro Abe, Yukinobu Watanabe

Engineering Science for Advanced energy system

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.

Original language	English
Title of host publication	2015 IEEE International Reliability Physics Symposium, IRPS 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	2C31-2C35
ISBN (Electronic)	9781467373623
DOIs	https://doi.org/10.1109/IRPS.2015.7112678
Publication status	Published - May 26 2015
Event	IEEE International Reliability Physics Symposium, IRPS 2015 - Monterey, United States Duration: Apr 19 2015 → Apr 23 2015

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
Volume	2015-May
ISSN (Print)	1541-7026

Other

Other	IEEE International Reliability Physics Symposium, IRPS 2015
Country/Territory	United States
City	Monterey
Period	4/19/15 → 4/23/15

All Science Journal Classification (ASJC) codes

Engineering(all)

Access to Document

10.1109/IRPS.2015.7112678

Cite this

Mori, H., Uemura, T., Matsuyama, H., Abe, S. I., & Watanabe, Y. (2015). Critical charge dependence of correlation of different neutron sources for soft error testing. In 2015 IEEE International Reliability Physics Symposium, IRPS 2015 (pp. 2C31-2C35). [7112678] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2015-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS.2015.7112678

Critical charge dependence of correlation of different neutron sources for soft error testing. / Mori, Hiroko; Uemura, Taiki; Matsuyama, Hideya et al.
2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 2C31-2C35 7112678 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2015-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Mori, H, Uemura, T, Matsuyama, H, Abe, SI & Watanabe, Y 2015, Critical charge dependence of correlation of different neutron sources for soft error testing. in 2015 IEEE International Reliability Physics Symposium, IRPS 2015., 7112678, IEEE International Reliability Physics Symposium Proceedings, vol. 2015-May, Institute of Electrical and Electronics Engineers Inc., pp. 2C31-2C35, IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, United States, 4/19/15. https://doi.org/10.1109/IRPS.2015.7112678

Mori H, Uemura T, Matsuyama H, Abe SI, Watanabe Y. Critical charge dependence of correlation of different neutron sources for soft error testing. In 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 2C31-2C35. 7112678. (IEEE International Reliability Physics Symposium Proceedings). doi: 10.1109/IRPS.2015.7112678

@inproceedings{c765881570044d0fbbfbc44932c9f960,

title = "Critical charge dependence of correlation of different neutron sources for soft error testing",

abstract = "We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.",

author = "Hiroko Mori and Taiki Uemura and Hideya Matsuyama and Abe, {Shin Ichiro} and Yukinobu Watanabe",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; IEEE International Reliability Physics Symposium, IRPS 2015 ; Conference date: 19-04-2015 Through 23-04-2015",

year = "2015",

month = may,

day = "26",

doi = "10.1109/IRPS.2015.7112678",

language = "English",

series = "IEEE International Reliability Physics Symposium Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "2C31--2C35",

booktitle = "2015 IEEE International Reliability Physics Symposium, IRPS 2015",

address = "United States",

}

TY - GEN

T1 - Critical charge dependence of correlation of different neutron sources for soft error testing

AU - Mori, Hiroko

AU - Uemura, Taiki

AU - Matsuyama, Hideya

AU - Abe, Shin Ichiro

AU - Watanabe, Yukinobu

PY - 2015/5/26

Y1 - 2015/5/26

N2 - We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.

AB - We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.

UR - http://www.scopus.com/inward/record.url?scp=84942940684&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84942940684&partnerID=8YFLogxK

U2 - 10.1109/IRPS.2015.7112678

DO - 10.1109/IRPS.2015.7112678

M3 - Conference contribution

AN - SCOPUS:84942940684

T3 - IEEE International Reliability Physics Symposium Proceedings

SP - 2C31-2C35

BT - 2015 IEEE International Reliability Physics Symposium, IRPS 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - IEEE International Reliability Physics Symposium, IRPS 2015

Y2 - 19 April 2015 through 23 April 2015

ER -

Critical charge dependence of correlation of different neutron sources for soft error testing

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