Critical charge dependence of correlation of different neutron sources for soft error testing

Hiroko Mori, Taiki Uemura, Hideya Matsuyama, Shin Ichiro Abe, Yukinobu Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigate the soft error rate (SER) deviations at sea level between calculation with JEDEC spectrum and measurements at acceleration test facilities. The ratio of SER calculated with the test facility's spectrum to that with the JEDEC spectrum is provided as a function of critical charge. This ration is used for estimation of the SER at sea level from the SER measured at test facilities. Single event upset (SEU) cross-sections necessary in derivation of the SER ratio are given by a multi-scale (particle transport and 3D TCAD) Monte Carlo simulation. Finally, the SER ratio is verified through acceleration tests in three facilities.

Original languageEnglish
Title of host publication2015 IEEE International Reliability Physics Symposium, IRPS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2C31-2C35
ISBN (Electronic)9781467373623
DOIs
Publication statusPublished - May 26 2015
EventIEEE International Reliability Physics Symposium, IRPS 2015 - Monterey, United States
Duration: Apr 19 2015Apr 23 2015

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
Volume2015-May
ISSN (Print)1541-7026

Other

OtherIEEE International Reliability Physics Symposium, IRPS 2015
CountryUnited States
CityMonterey
Period4/19/154/23/15

Fingerprint

Neutron sources
Testing
Test facilities
Sea level

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Mori, H., Uemura, T., Matsuyama, H., Abe, S. I., & Watanabe, Y. (2015). Critical charge dependence of correlation of different neutron sources for soft error testing. In 2015 IEEE International Reliability Physics Symposium, IRPS 2015 (pp. 2C31-2C35). [7112678] (IEEE International Reliability Physics Symposium Proceedings; Vol. 2015-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS.2015.7112678

Critical charge dependence of correlation of different neutron sources for soft error testing. / Mori, Hiroko; Uemura, Taiki; Matsuyama, Hideya; Abe, Shin Ichiro; Watanabe, Yukinobu.

2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 2C31-2C35 7112678 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2015-May).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mori, H, Uemura, T, Matsuyama, H, Abe, SI & Watanabe, Y 2015, Critical charge dependence of correlation of different neutron sources for soft error testing. in 2015 IEEE International Reliability Physics Symposium, IRPS 2015., 7112678, IEEE International Reliability Physics Symposium Proceedings, vol. 2015-May, Institute of Electrical and Electronics Engineers Inc., pp. 2C31-2C35, IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, United States, 4/19/15. https://doi.org/10.1109/IRPS.2015.7112678
Mori H, Uemura T, Matsuyama H, Abe SI, Watanabe Y. Critical charge dependence of correlation of different neutron sources for soft error testing. In 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 2C31-2C35. 7112678. (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2015.7112678
Mori, Hiroko ; Uemura, Taiki ; Matsuyama, Hideya ; Abe, Shin Ichiro ; Watanabe, Yukinobu. / Critical charge dependence of correlation of different neutron sources for soft error testing. 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 2C31-2C35 (IEEE International Reliability Physics Symposium Proceedings).
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