The critical current density and the irreversibility field were measured for a coated Y-123 tape prepared by IBAD method. These results were compared with those of Y-123 thin film deposited on single crystal STO. It was found that Jc of the tape has a weaker magnetic field dependence, although its value at low fields is fairly lower than that of the thin film. This comes from the difference of the thickness. The lower Jc at low fields is due to the collective pinning property, and the better irreversibility at high fields can be attributed to a larger flux bundle volume. These results were compared with the calculated results using the flux creep-flow theory, and a good agreement was obtained. Jc was estimated with the aid of this theory assuming that a high-quality thick tape of 5 μm thick with strong pinning can be fabricated.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering