Critical thickness of BaSnO3 buffer layer for YBa2Cu3O7-δ thin films on MgO substrates

K. Chiba, S. Makino, M. Mukaida, M. Kusunoki, S. Ohshima

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Abstract

The critical thickness of BaSnO3 (BSO) buffer layer for YBa2Cu3O7-δ (YBCO) thin films on MgO substrate is discussed from viewpoints of the in-plane orientation and critical temperature. Thin films are grown by changing the thickness of BSO buffer layers at optimal growth temperature of YBCO films by pulse laser deposition. We are able to control the in-plane orientation of YBCO films with the BSO buffer layers thicker than 2 nm. This result indicates that BSO buffer layers can control the in-plane orientation of YBCO with a thickness less than the other buffer materials reported so far.

Original languageEnglish
Pages (from-to)35-39
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume349
Issue number1-2
DOIs
Publication statusPublished - Jan 1 2001
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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