Cross-sectional examination of surface layers on electropolished thin specimens

Y. Wakaki, Y. Otsuka, Zenji Horita, M. Nishimura, T. Sano, Y. Murata, M. Nemoto

Research output: Contribution to journalConference article

Abstract

This study examines the structure of surface layers produced during electropolishing for preparation of electron-transparent thin specimens of Al-3.80wt%Cu. The observation and microanalysis are first conducted in plan view of as-electropolished specimens with the AEM (analytical electron microscope) and SIMS secondary ion mass spectrometer. Then, ultramicrotomy is used to obtain thin cross sections of as-electropolished specimens. The cross-sectional observation and microanalysis are performed with the high-resolution CTEM (conventional transmission electron microscope) and AEM. Specimens were thinned for electron microscopy with the twin-jet electropolishing technique. Two different electrolytes were used: a mixture of 15% perchloric acid, 10% glycerol, and 75% ethanol (the PA specimen) and 30% nitric acid and 70% methanol (the NA specimen). Plan view analysis with the AEM and SIMS showed that a Cu-rich layer is present on both PA and NA specimens: the layer on the PA specimen is thicker than that on the NA specimen. This result was demonstrated more clearly by cross-sectional observations and microanalysis using high-resolution CTEM and AEM. The layer thickness was found to be approximately 50 nm for the PA specimen and 5 approximately 10 nm or the NA specimen.

Original languageEnglish
Pages (from-to)323-326
Number of pages4
JournalProceedings, Annual Conference - Microbeam Analysis Society
Publication statusPublished - Dec 1 1990
Externally publishedYes
EventProceedings of the 25th Annual Conference of the Microbeam Analysis Society presented at the 12th International Congress for Electron Microscopy - Seattle, WA, USA
Duration: Aug 12 1990Aug 18 1990

Fingerprint

Electron microscopes
Microanalysis
Electrolytic polishing
Secondary ion mass spectrometry
Mass spectrometers
Nitric acid
Glycerol
Electron microscopy
Methanol
Ethanol
Electrolytes
Acids
Electrons
Ions

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Wakaki, Y., Otsuka, Y., Horita, Z., Nishimura, M., Sano, T., Murata, Y., & Nemoto, M. (1990). Cross-sectional examination of surface layers on electropolished thin specimens. Proceedings, Annual Conference - Microbeam Analysis Society, 323-326.

Cross-sectional examination of surface layers on electropolished thin specimens. / Wakaki, Y.; Otsuka, Y.; Horita, Zenji; Nishimura, M.; Sano, T.; Murata, Y.; Nemoto, M.

In: Proceedings, Annual Conference - Microbeam Analysis Society, 01.12.1990, p. 323-326.

Research output: Contribution to journalConference article

Wakaki, Y, Otsuka, Y, Horita, Z, Nishimura, M, Sano, T, Murata, Y & Nemoto, M 1990, 'Cross-sectional examination of surface layers on electropolished thin specimens', Proceedings, Annual Conference - Microbeam Analysis Society, pp. 323-326.
Wakaki, Y. ; Otsuka, Y. ; Horita, Zenji ; Nishimura, M. ; Sano, T. ; Murata, Y. ; Nemoto, M. / Cross-sectional examination of surface layers on electropolished thin specimens. In: Proceedings, Annual Conference - Microbeam Analysis Society. 1990 ; pp. 323-326.
@article{29ce74bdd22a453090db2b5037049a7d,
title = "Cross-sectional examination of surface layers on electropolished thin specimens",
abstract = "This study examines the structure of surface layers produced during electropolishing for preparation of electron-transparent thin specimens of Al-3.80wt{\%}Cu. The observation and microanalysis are first conducted in plan view of as-electropolished specimens with the AEM (analytical electron microscope) and SIMS secondary ion mass spectrometer. Then, ultramicrotomy is used to obtain thin cross sections of as-electropolished specimens. The cross-sectional observation and microanalysis are performed with the high-resolution CTEM (conventional transmission electron microscope) and AEM. Specimens were thinned for electron microscopy with the twin-jet electropolishing technique. Two different electrolytes were used: a mixture of 15{\%} perchloric acid, 10{\%} glycerol, and 75{\%} ethanol (the PA specimen) and 30{\%} nitric acid and 70{\%} methanol (the NA specimen). Plan view analysis with the AEM and SIMS showed that a Cu-rich layer is present on both PA and NA specimens: the layer on the PA specimen is thicker than that on the NA specimen. This result was demonstrated more clearly by cross-sectional observations and microanalysis using high-resolution CTEM and AEM. The layer thickness was found to be approximately 50 nm for the PA specimen and 5 approximately 10 nm or the NA specimen.",
author = "Y. Wakaki and Y. Otsuka and Zenji Horita and M. Nishimura and T. Sano and Y. Murata and M. Nemoto",
year = "1990",
month = "12",
day = "1",
language = "English",
pages = "323--326",
journal = "Proceedings, Annual Conference - Microbeam Analysis Society",
issn = "0278-1727",

}

TY - JOUR

T1 - Cross-sectional examination of surface layers on electropolished thin specimens

AU - Wakaki, Y.

AU - Otsuka, Y.

AU - Horita, Zenji

AU - Nishimura, M.

AU - Sano, T.

AU - Murata, Y.

AU - Nemoto, M.

PY - 1990/12/1

Y1 - 1990/12/1

N2 - This study examines the structure of surface layers produced during electropolishing for preparation of electron-transparent thin specimens of Al-3.80wt%Cu. The observation and microanalysis are first conducted in plan view of as-electropolished specimens with the AEM (analytical electron microscope) and SIMS secondary ion mass spectrometer. Then, ultramicrotomy is used to obtain thin cross sections of as-electropolished specimens. The cross-sectional observation and microanalysis are performed with the high-resolution CTEM (conventional transmission electron microscope) and AEM. Specimens were thinned for electron microscopy with the twin-jet electropolishing technique. Two different electrolytes were used: a mixture of 15% perchloric acid, 10% glycerol, and 75% ethanol (the PA specimen) and 30% nitric acid and 70% methanol (the NA specimen). Plan view analysis with the AEM and SIMS showed that a Cu-rich layer is present on both PA and NA specimens: the layer on the PA specimen is thicker than that on the NA specimen. This result was demonstrated more clearly by cross-sectional observations and microanalysis using high-resolution CTEM and AEM. The layer thickness was found to be approximately 50 nm for the PA specimen and 5 approximately 10 nm or the NA specimen.

AB - This study examines the structure of surface layers produced during electropolishing for preparation of electron-transparent thin specimens of Al-3.80wt%Cu. The observation and microanalysis are first conducted in plan view of as-electropolished specimens with the AEM (analytical electron microscope) and SIMS secondary ion mass spectrometer. Then, ultramicrotomy is used to obtain thin cross sections of as-electropolished specimens. The cross-sectional observation and microanalysis are performed with the high-resolution CTEM (conventional transmission electron microscope) and AEM. Specimens were thinned for electron microscopy with the twin-jet electropolishing technique. Two different electrolytes were used: a mixture of 15% perchloric acid, 10% glycerol, and 75% ethanol (the PA specimen) and 30% nitric acid and 70% methanol (the NA specimen). Plan view analysis with the AEM and SIMS showed that a Cu-rich layer is present on both PA and NA specimens: the layer on the PA specimen is thicker than that on the NA specimen. This result was demonstrated more clearly by cross-sectional observations and microanalysis using high-resolution CTEM and AEM. The layer thickness was found to be approximately 50 nm for the PA specimen and 5 approximately 10 nm or the NA specimen.

UR - http://www.scopus.com/inward/record.url?scp=0025552256&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0025552256&partnerID=8YFLogxK

M3 - Conference article

SP - 323

EP - 326

JO - Proceedings, Annual Conference - Microbeam Analysis Society

JF - Proceedings, Annual Conference - Microbeam Analysis Society

SN - 0278-1727

ER -