Crystal orientation and microstructure of CeO2 thin films grown on biaxially textured metallic substrates

Kaname Matsumoto, Hideyuki Shii, Ataru Ichinose, Hiroki Adachi, Yutaka Yoshida, Shigeru Horii, Masashi Mukaida, Kozo Osamura

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have fabricated biaxially textured Ni and Ni-0.1 mass%Cr (Ni-Cr) tapes, and crystal orientation and microstructure of CeO2 films deposited on the tapes by pulsed laser deposition were investigated. Recrystallized Ni-Cr tapes had a strong cube texture, {100} 〈001〈 orientation, and the surface of the tapes was occupied by the (100) oriented grains. CeO2 films grown on the Ni-Cr surface showed both the (100) preferred orientation and the strong in-plane alignment. Although recrystallized Ni tapes exhibited the {100}〈001〈 texture and the CeO2 films subsequently deposited on the tapes also have (100) orientation, a large number of (111) oriented grains were included in the films. The difference between the films deposited on the Ni-Cr and the pure Ni tapes depended on the degree of the cube texture and the surface flatness of the tapes. The preferred orientation of CeO2 films was also affected by the oxygen partial pressure during pulsed laser deposition, and the strong (100) orientation was attained under the pressure of 2.7 × 10-3 Pa. Moreover, the degree of the (100) orientation of CeO2 films was improved with increase of the film thickness. The microstructure of the films and its texture evolution mechanism were discussed.

Original languageEnglish
Pages (from-to)730-736
Number of pages7
JournalNippon Kinzoku Gakkaishi/Journal of the Japan Institute of Metals
Volume68
Issue number9
DOIs
Publication statusPublished - Jan 1 2004
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys
  • Materials Chemistry

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