Crystallinity and surface morphology of YBCO thin films using an amorphous buffer layer deposited at a low temperature

Yoshitaka Nakamura, Tomitsugu Tsuchihata, Shin Kudo, Tsutomu Kawamata, Masashi Mukaida, Shigetoshi Ohshima

Research output: Contribution to journalConference articlepeer-review

Abstract

We have investigated the crystallinity and surface morphology of main YBCO films and buffer layers deposited on an MgO substrate by a low temperature buffer layer deposition technique. A significant improvement in the crystalline quality of the YBCO film is achieved when an amorphous buffer layer of 100 [nm] in thickness on bare MgO substrate annealed at 930 [°C] is crystallized by annealing temperature 950[°C] for 1 hour in an air atmosphere. The surface of main YBCO films has pyramid like large grains when YBCO films have good crystallinity. We confirmed that YBCO films grown on a well-crystallized buffer layer had better crystallinity than ones grown on bare MgO substrate.

Original languageEnglish
Pages (from-to)2717-2720
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume13
Issue number2 III
DOIs
Publication statusPublished - Jun 2003
Externally publishedYes
Event2002 Applied Superconductivity Conference - Houston, TX, United States
Duration: Aug 4 2002Aug 9 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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