Current-waveform dependence of punchthrough probability in a Josephson tunnel junction

Keiji Enpuku, F. Irie, T. Nagatsuma, K. Yoshida

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

The so-called punchthrough phenomenon occurring in a logic gate using a Josephson tunnel junction is studied theoretically. An analytical solution of the Josephson equation describing the dynamic behavior of the Josephson gate in its resetting process is obtained with the modified averaged Lagrangian method. The solution leads to an expression for the punchthrough probability, which is capable of quantitative discussion and is applicable to arbitrary waveforms of the gate current. From the obtained expression, a study is made of the waveform dependence of the punchthrough probability, as well as its dependence on junction parameters. It is shown that the present analytical results agree well with those of computer simulations.

Original languageEnglish
Pages (from-to)8894-8900
Number of pages7
JournalJournal of Applied Physics
Volume53
Issue number12
DOIs
Publication statusPublished - 1982

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tunnel junctions
waveforms
logic
computerized simulation

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Current-waveform dependence of punchthrough probability in a Josephson tunnel junction. / Enpuku, Keiji; Irie, F.; Nagatsuma, T.; Yoshida, K.

In: Journal of Applied Physics, Vol. 53, No. 12, 1982, p. 8894-8900.

Research output: Contribution to journalArticle

Enpuku, Keiji ; Irie, F. ; Nagatsuma, T. ; Yoshida, K. / Current-waveform dependence of punchthrough probability in a Josephson tunnel junction. In: Journal of Applied Physics. 1982 ; Vol. 53, No. 12. pp. 8894-8900.
@article{aa217d15203b4d9a917f15d013d96533,
title = "Current-waveform dependence of punchthrough probability in a Josephson tunnel junction",
abstract = "The so-called punchthrough phenomenon occurring in a logic gate using a Josephson tunnel junction is studied theoretically. An analytical solution of the Josephson equation describing the dynamic behavior of the Josephson gate in its resetting process is obtained with the modified averaged Lagrangian method. The solution leads to an expression for the punchthrough probability, which is capable of quantitative discussion and is applicable to arbitrary waveforms of the gate current. From the obtained expression, a study is made of the waveform dependence of the punchthrough probability, as well as its dependence on junction parameters. It is shown that the present analytical results agree well with those of computer simulations.",
author = "Keiji Enpuku and F. Irie and T. Nagatsuma and K. Yoshida",
year = "1982",
doi = "10.1063/1.330444",
language = "English",
volume = "53",
pages = "8894--8900",
journal = "Journal of Applied Physics",
issn = "0021-8979",
publisher = "American Institute of Physics Publising LLC",
number = "12",

}

TY - JOUR

T1 - Current-waveform dependence of punchthrough probability in a Josephson tunnel junction

AU - Enpuku, Keiji

AU - Irie, F.

AU - Nagatsuma, T.

AU - Yoshida, K.

PY - 1982

Y1 - 1982

N2 - The so-called punchthrough phenomenon occurring in a logic gate using a Josephson tunnel junction is studied theoretically. An analytical solution of the Josephson equation describing the dynamic behavior of the Josephson gate in its resetting process is obtained with the modified averaged Lagrangian method. The solution leads to an expression for the punchthrough probability, which is capable of quantitative discussion and is applicable to arbitrary waveforms of the gate current. From the obtained expression, a study is made of the waveform dependence of the punchthrough probability, as well as its dependence on junction parameters. It is shown that the present analytical results agree well with those of computer simulations.

AB - The so-called punchthrough phenomenon occurring in a logic gate using a Josephson tunnel junction is studied theoretically. An analytical solution of the Josephson equation describing the dynamic behavior of the Josephson gate in its resetting process is obtained with the modified averaged Lagrangian method. The solution leads to an expression for the punchthrough probability, which is capable of quantitative discussion and is applicable to arbitrary waveforms of the gate current. From the obtained expression, a study is made of the waveform dependence of the punchthrough probability, as well as its dependence on junction parameters. It is shown that the present analytical results agree well with those of computer simulations.

UR - http://www.scopus.com/inward/record.url?scp=0020271725&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020271725&partnerID=8YFLogxK

U2 - 10.1063/1.330444

DO - 10.1063/1.330444

M3 - Article

VL - 53

SP - 8894

EP - 8900

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 12

ER -