Defect and field-enhancement characterization through electron-beam-induced current analysis

Hitoshi Umezawa, Hiroki Gima, Khaled Driche, Yukako Kato, Tsuyoshi Yoshitake, Yoshiaki Mokuno, Etienne Gheeraert

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

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Physics & Astronomy