Deflecting atoms through a submicron-sized slit with near-field light

Kazuhiro Yamamoto, Kouki Totsuka, Haruhiko Ito

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We report experiments on deflecting cold 87Rb atoms by repulsive near-field light induced in a 200-nm-wide slit. The spatial profile is measured with a two-step photoionization scan. The number of outputted atoms from the slit increases by the amount of 40 ± 7.2% at a 5.1 ± 2.0° angle for the blue detuning of +1 GHz. We discuss the spatial profile involving an image of the atomic cloud by means of the scattering cross section.

Original languageEnglish
Pages (from-to)357-360
Number of pages4
JournalOptical Review
Volume13
Issue number5
DOIs
Publication statusPublished - Sep 1 2006

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slits
near fields
profiles
scattering cross sections
atoms
photoionization

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Cite this

Deflecting atoms through a submicron-sized slit with near-field light. / Yamamoto, Kazuhiro; Totsuka, Kouki; Ito, Haruhiko.

In: Optical Review, Vol. 13, No. 5, 01.09.2006, p. 357-360.

Research output: Contribution to journalArticle

Yamamoto, Kazuhiro ; Totsuka, Kouki ; Ito, Haruhiko. / Deflecting atoms through a submicron-sized slit with near-field light. In: Optical Review. 2006 ; Vol. 13, No. 5. pp. 357-360.
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