Degradation analysis of 2-μm DFB laser using optical beam-induced current technique

Tatsuya Takeshita, Tomonari Sato, Manabu Mitsuhara, Yasuhiro Kondo, Mitsuru Sugo, Kazutoshi Kato

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The degradation behavior of 2-μm wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified that the epitaxial layers on the mesa affect both first- and second-stage degradations.

Original languageEnglish
Pages (from-to)2644-2649
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume54
Issue number10
DOIs
Publication statusPublished - Oct 1 2007
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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