Degradation analysis of REBCO coils

D. X. Ma, S. Matsumoto, Ryo Teranishi, T. Ohmura, T. Kiyoshi, A. Otsuka, M. Hamada, H. Maeda, Y. Yanagisawa, H. Nakagome, H. Suematsu

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

RE-Ba-Cu-O (REBCO) layer-wound coils were operated to investigate their properties under electromagnetic forces in an external magnetic field of up to 17.2 T. While REBCO coils were successfully operated under electromagnetic forces over 200 MPa, some showed degradation after quenching. To develop high-temperature superconducting (HTS) magnets, the reasons for the degradation of REBCO coils should be investigated. In this study, the degraded REBCO coils were carefully rewound. The critical current (Ic) of the rewound REBCO conductor was measured to check the damaged parts in the degraded REBCO coils, and the possible causes for the degradation were discussed.

Original languageEnglish
Article number085014
JournalSuperconductor Science and Technology
Volume27
Issue number8
DOIs
Publication statusPublished - Aug 1 2014

Fingerprint

coils
degradation
Degradation
Superconducting magnets
Critical currents
Quenching
electromagnetism
Magnetic fields
superconducting magnets
critical current
conductors
quenching
causes
Temperature
magnetic fields

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Ma, D. X., Matsumoto, S., Teranishi, R., Ohmura, T., Kiyoshi, T., Otsuka, A., ... Suematsu, H. (2014). Degradation analysis of REBCO coils. Superconductor Science and Technology, 27(8), [085014]. https://doi.org/10.1088/0953-2048/27/8/085014

Degradation analysis of REBCO coils. / Ma, D. X.; Matsumoto, S.; Teranishi, Ryo; Ohmura, T.; Kiyoshi, T.; Otsuka, A.; Hamada, M.; Maeda, H.; Yanagisawa, Y.; Nakagome, H.; Suematsu, H.

In: Superconductor Science and Technology, Vol. 27, No. 8, 085014, 01.08.2014.

Research output: Contribution to journalArticle

Ma, DX, Matsumoto, S, Teranishi, R, Ohmura, T, Kiyoshi, T, Otsuka, A, Hamada, M, Maeda, H, Yanagisawa, Y, Nakagome, H & Suematsu, H 2014, 'Degradation analysis of REBCO coils', Superconductor Science and Technology, vol. 27, no. 8, 085014. https://doi.org/10.1088/0953-2048/27/8/085014
Ma DX, Matsumoto S, Teranishi R, Ohmura T, Kiyoshi T, Otsuka A et al. Degradation analysis of REBCO coils. Superconductor Science and Technology. 2014 Aug 1;27(8). 085014. https://doi.org/10.1088/0953-2048/27/8/085014
Ma, D. X. ; Matsumoto, S. ; Teranishi, Ryo ; Ohmura, T. ; Kiyoshi, T. ; Otsuka, A. ; Hamada, M. ; Maeda, H. ; Yanagisawa, Y. ; Nakagome, H. ; Suematsu, H. / Degradation analysis of REBCO coils. In: Superconductor Science and Technology. 2014 ; Vol. 27, No. 8.
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