Delocalization corrections using a disordered structure for atom location by channelling-enhanced microanalysis in the Ni-Al system

Z. Horita, H. Kuninaka, T. Sano, M. Nemoto, J. C.H. Spence

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    11 Citations (Scopus)

    Abstract

    A correction procedure for the delocalization effect when determining the site occupancy of an impurity element by atom location by channelling-enhanced microanalysis is proposed. The procedure utilizes a disordered structure with a composition similar to the ordered structure. Correction factors are derived by illuminating a sample with a disordered structure in the same orientation as for the ordered structure. The correction procedure is applied to a determination of the Ti occupancy in a Ni3Al intermetallic compound.

    Original languageEnglish
    Pages (from-to)425-432
    Number of pages8
    JournalPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
    Volume67
    Issue number2
    DOIs
    Publication statusPublished - Feb 1993

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Materials Science(all)
    • Condensed Matter Physics
    • Physics and Astronomy (miscellaneous)
    • Metals and Alloys

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