Demonstration of knock intensity mitigation through dielectric barrier discharge reformation in an RCEM

Eiichi Takahashi, Yukihide Nagano, Toshiaki Kitagawa, Makihito Nishioka, Taizo Nakamura, Michio Nakano

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science