Dense 3D reconstruction method using coplanarities and metric constraints for line laser scanning

Hiroshi Kawasaki, Ryo Furukawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Abstract

In this paper, we propose a novel method to achieve both dense 3D reconstruction of the scene and estimation of the camera intrinsic parameters by using coplanarities and other constraints (e.g. orthogonalities or parallelisms) derived from relations between planes in the scene and reflected curves of line lasers captured by a single camera. In our study, we categorize coplanarities in the scene into two types: implicit coplanarities, which can be observed as reflected curves of line lasers, and explicit coplanarities, which are, for example, observed as walls of a building. By using both types of coplanarities, we can construct simultaneous equations and can solve them up to four degrees of freedom. To upgrade the solution to the Euclidean space and estimate the camera intrinsic parameters, we can use metric constraints such as orthogonalities of the planes. Such metric constraints are given by, for example, observing the corners of rectangular boxes in the scene, or using special laser projecting device composed of two line lasers whose laser planes are configured to be perpendicular.

Original languageEnglish
Title of host publicationProceedings - 6th International Conference on 3-D Digital Imaging and Modeling, 3DIM 2007
Pages149-156
Number of pages8
DOIs
Publication statusPublished - 2007
Externally publishedYes
Event6th International Conference on 3-D Digital Imaging and Modeling, 3DIM 2007 - Montreal, QC, Canada
Duration: Aug 21 2007Aug 23 2007

Publication series

Name3DIM 2007 - Proceedings 6th International Conference on 3-D Digital Imaging and Modeling

Other

Other6th International Conference on 3-D Digital Imaging and Modeling, 3DIM 2007
CountryCanada
CityMontreal, QC
Period8/21/078/23/07

All Science Journal Classification (ASJC) codes

  • Computer Graphics and Computer-Aided Design
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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