Dependable VLSI: Device, design and architecture-How should they co-operate ?

Shuichi Sakai, Hidetoshi Onodera, Hiroto Yasuura, James C. Hoe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

VLSI dependability is one of the most significant issues in the modern world. Here the panelists will discuss the key technologies for it as well as the cost optimization among device, design and architecture.

Original languageEnglish
Title of host publicationProceedings of the ASP-DAC 2009
Subtitle of host publicationAsia and South Pacific Design Automation Conference 2009
Pages859-860
Number of pages2
DOIs
Publication statusPublished - Apr 20 2009
EventAsia and South Pacific Design Automation Conference 2009, ASP-DAC 2009 - Yokohama, Japan
Duration: Jan 19 2009Jan 22 2009

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Other

OtherAsia and South Pacific Design Automation Conference 2009, ASP-DAC 2009
CountryJapan
CityYokohama
Period1/19/091/22/09

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All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

Sakai, S., Onodera, H., Yasuura, H., & Hoe, J. C. (2009). Dependable VLSI: Device, design and architecture-How should they co-operate ? In Proceedings of the ASP-DAC 2009: Asia and South Pacific Design Automation Conference 2009 (pp. 859-860). [4796588] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC). https://doi.org/10.1109/ASPDAC.2009.4796588