Dependence of crystalline orientation on film thickness of sputtered YBa2Cu3O 7-x on an MgO substrate

Y. Nakamura, S. Kudo, M. Mukaida, S. Ohshima

Research output: Contribution to journalConference articlepeer-review

6 Citations (Scopus)


We have systematically investigated dependence of crystalline orientation on film thickness of sputtered YBa2Cu3O7-x (YBCO) on an MgO substrate by the X-ray diffraction (XRD) method, the φ diffraction method and atomic force microscope (AFM). From examination of crystalline orientation by XRD method and in-plane orientation by the φ diffraction method, for thinner film below about 500 nm, the YBCO film is oriented with the c-axis perpendicular to the MgO substrate surface. For thicker film above about 500 nm, the c-axis oriented grains in the YBCO film vanish entirely and the a-axis oriented grains are formed. The rectangular images of a-axis oriented grains are also observed on the surface by AFM. We found that the crystalline orientation change drastically from c-axis oriented films to a-axis oriented films with increasing film thickness.

Original languageEnglish
Pages (from-to)1276-1280
Number of pages5
JournalPhysica C: Superconductivity and its applications
Issue numberPART 2
Publication statusPublished - Oct 2003
Externally publishedYes
EventProceedings of the 15th International Symposium on Superconduc - Yokohama, Japan
Duration: Nov 11 2002Nov 13 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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