Dependence of YBa2Cu3O7-x ultrathin film surface morphology on substrate and growth temperature

Takashi Tsurumaki, Shingo Uehara, Masashi Mukaida

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We have studied the influence of substrate matching and growth temperature on the morphology of YBa2Cu3O7-x: ultrathin film. For films grown on SrTiO3 and NdGaO3 substrates, we observed a temperature-dependent surface morphology. The film changed from a smooth epitaxial layer at growth temperatures equal to or below 750°C, into one with several unit-cell-high islands at 800°C. It was also found that the density of these islands differs between films on SrTiO3 and NdGaO3 substrates. This substrate-dependent island density was interpreted in terms of the Stransky-Krastanov-type film structure model together with an assumed temperature dependence of the epitaxial layer thickness.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume35
Issue number8 PART A
Publication statusPublished - Aug 1 1996
Externally publishedYes

Fingerprint

Ultrathin films
Growth temperature
Surface morphology
Epitaxial layers
Substrates
temperature
Model structures
Temperature
temperature dependence
cells

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

Dependence of YBa2Cu3O7-x ultrathin film surface morphology on substrate and growth temperature. / Tsurumaki, Takashi; Uehara, Shingo; Mukaida, Masashi.

In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 35, No. 8 PART A, 01.08.1996.

Research output: Contribution to journalArticle

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