Depth-dependent structural analyses in PS-b-P2VP thin films as revealed by grazing incidence small angle scattering in the tender energy region

Hiroki Ogawa, Kouta Tsujioka, Mikihito Takenaka, Kazutaka Kamitani, Takeharu Sugiyama, Toshiji Kanaya, Atsushi Takahara

Research output: Contribution to journalArticle

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Abstract

We report depth-resolved structural measurements in symmetric PS-b-P2VP thin films, using grazing incidence small angle X-ray scattering (GISAXS) in the tender X-ray region. The nanostructures in thin films show cylindrical structures although lamellar structures are expected, thermodynamically, as equilibrium state. It has been reported that, when the thin films are annealed at temperatures greater than the Tg, lamellar structures formed, parallel to the substrate. We prepared as-cast and annealed thin films on silicon substrates. From GISAXS measurements, we concluded that vertical cylindrical nanostructures in as-cast thin films are formed, oriented from surface toward substrate interface. Annealing changed the vertical cylindrical nanostructures at the surface. Even after very long annealing, like 12 hours above Tg, we found that vertical nanostructures still remained at the substrate interface, due to the lower mobility of polymer chains near the substrate interface.

Original languageEnglish
Pages (from-to)109-113
Number of pages5
JournalKOBUNSHI RONBUNSHU
Volume74
Issue number2
DOIs
Publication statusPublished - Mar 1 2017

Fingerprint

grazing
scattering
Scattering
Nanostructures
substrate
Thin films
Substrates
Lamellar structures
energy
annealing
X ray scattering
Annealing
Silicon
silicon
Polymers
polymer
poly(styrene)-block-poly(2-vinylpyrindine) diblock copolymer
X rays
temperature
Temperature

All Science Journal Classification (ASJC) codes

  • Chemical Engineering (miscellaneous)
  • Materials Science (miscellaneous)
  • Environmental Science(all)
  • Polymers and Plastics

Cite this

Depth-dependent structural analyses in PS-b-P2VP thin films as revealed by grazing incidence small angle scattering in the tender energy region. / Ogawa, Hiroki; Tsujioka, Kouta; Takenaka, Mikihito; Kamitani, Kazutaka; Sugiyama, Takeharu; Kanaya, Toshiji; Takahara, Atsushi.

In: KOBUNSHI RONBUNSHU, Vol. 74, No. 2, 01.03.2017, p. 109-113.

Research output: Contribution to journalArticle

Ogawa, Hiroki ; Tsujioka, Kouta ; Takenaka, Mikihito ; Kamitani, Kazutaka ; Sugiyama, Takeharu ; Kanaya, Toshiji ; Takahara, Atsushi. / Depth-dependent structural analyses in PS-b-P2VP thin films as revealed by grazing incidence small angle scattering in the tender energy region. In: KOBUNSHI RONBUNSHU. 2017 ; Vol. 74, No. 2. pp. 109-113.
@article{14604fea593043549a7355a3c3b620db,
title = "Depth-dependent structural analyses in PS-b-P2VP thin films as revealed by grazing incidence small angle scattering in the tender energy region",
abstract = "We report depth-resolved structural measurements in symmetric PS-b-P2VP thin films, using grazing incidence small angle X-ray scattering (GISAXS) in the tender X-ray region. The nanostructures in thin films show cylindrical structures although lamellar structures are expected, thermodynamically, as equilibrium state. It has been reported that, when the thin films are annealed at temperatures greater than the Tg, lamellar structures formed, parallel to the substrate. We prepared as-cast and annealed thin films on silicon substrates. From GISAXS measurements, we concluded that vertical cylindrical nanostructures in as-cast thin films are formed, oriented from surface toward substrate interface. Annealing changed the vertical cylindrical nanostructures at the surface. Even after very long annealing, like 12 hours above Tg, we found that vertical nanostructures still remained at the substrate interface, due to the lower mobility of polymer chains near the substrate interface.",
author = "Hiroki Ogawa and Kouta Tsujioka and Mikihito Takenaka and Kazutaka Kamitani and Takeharu Sugiyama and Toshiji Kanaya and Atsushi Takahara",
year = "2017",
month = "3",
day = "1",
doi = "10.1295/koron.2016-0058",
language = "English",
volume = "74",
pages = "109--113",
journal = "Kobunshi Ronbunshu",
issn = "0386-2186",
publisher = "The Society of Polymer Science, Japan",
number = "2",

}

TY - JOUR

T1 - Depth-dependent structural analyses in PS-b-P2VP thin films as revealed by grazing incidence small angle scattering in the tender energy region

AU - Ogawa, Hiroki

AU - Tsujioka, Kouta

AU - Takenaka, Mikihito

AU - Kamitani, Kazutaka

AU - Sugiyama, Takeharu

AU - Kanaya, Toshiji

AU - Takahara, Atsushi

PY - 2017/3/1

Y1 - 2017/3/1

N2 - We report depth-resolved structural measurements in symmetric PS-b-P2VP thin films, using grazing incidence small angle X-ray scattering (GISAXS) in the tender X-ray region. The nanostructures in thin films show cylindrical structures although lamellar structures are expected, thermodynamically, as equilibrium state. It has been reported that, when the thin films are annealed at temperatures greater than the Tg, lamellar structures formed, parallel to the substrate. We prepared as-cast and annealed thin films on silicon substrates. From GISAXS measurements, we concluded that vertical cylindrical nanostructures in as-cast thin films are formed, oriented from surface toward substrate interface. Annealing changed the vertical cylindrical nanostructures at the surface. Even after very long annealing, like 12 hours above Tg, we found that vertical nanostructures still remained at the substrate interface, due to the lower mobility of polymer chains near the substrate interface.

AB - We report depth-resolved structural measurements in symmetric PS-b-P2VP thin films, using grazing incidence small angle X-ray scattering (GISAXS) in the tender X-ray region. The nanostructures in thin films show cylindrical structures although lamellar structures are expected, thermodynamically, as equilibrium state. It has been reported that, when the thin films are annealed at temperatures greater than the Tg, lamellar structures formed, parallel to the substrate. We prepared as-cast and annealed thin films on silicon substrates. From GISAXS measurements, we concluded that vertical cylindrical nanostructures in as-cast thin films are formed, oriented from surface toward substrate interface. Annealing changed the vertical cylindrical nanostructures at the surface. Even after very long annealing, like 12 hours above Tg, we found that vertical nanostructures still remained at the substrate interface, due to the lower mobility of polymer chains near the substrate interface.

UR - http://www.scopus.com/inward/record.url?scp=85017141288&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85017141288&partnerID=8YFLogxK

U2 - 10.1295/koron.2016-0058

DO - 10.1295/koron.2016-0058

M3 - Article

AN - SCOPUS:85017141288

VL - 74

SP - 109

EP - 113

JO - Kobunshi Ronbunshu

JF - Kobunshi Ronbunshu

SN - 0386-2186

IS - 2

ER -