Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector

Takeshi Hara, Yoshihiro Nojiri, Kenji Hanada, Tsuyoshi Yoshitake

    Research output: Contribution to journalArticle

    1 Citation (Scopus)

    Abstract

    Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.

    Original languageEnglish
    Article number108002
    JournalJapanese Journal of Applied Physics
    Volume54
    Issue number10
    DOIs
    Publication statusPublished - Oct 1 2015

    Fingerprint

    Semiconductor counters
    Carbon films
    Amorphous carbon
    Composite films
    Diamonds
    counters
    Diffraction
    diamonds
    Detectors
    X ray diffraction
    X ray powder diffraction
    composite materials
    carbon
    detectors
    diffraction
    Plasma deposition
    radiation sources
    x rays
    Synchrotron radiation
    Transmission electron microscopy

    All Science Journal Classification (ASJC) codes

    • Engineering(all)
    • Physics and Astronomy(all)

    Cite this

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    abstract = "Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.",
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    T1 - Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector

    AU - Hara, Takeshi

    AU - Nojiri, Yoshihiro

    AU - Hanada, Kenji

    AU - Yoshitake, Tsuyoshi

    PY - 2015/10/1

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    AB - Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.

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