Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector

Takeshi Hara; Yoshihiro Nojiri; Kenji Hanada; Tsuyoshi Yoshitake

doi:10.7567/JJAP.54.108002

Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector

Takeshi Hara, Yoshihiro Nojiri, Kenji Hanada, Tsuyoshi Yoshitake

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.

Original language	English
Article number	108002
Journal	Japanese journal of applied physics
Volume	54
Issue number	10
DOIs	https://doi.org/10.7567/JJAP.54.108002
Publication status	Published - Oct 1 2015

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy(all)

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10.7567/JJAP.54.108002

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Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector. / Hara, Takeshi; Nojiri, Yoshihiro; Hanada, Kenji et al.

In: Japanese journal of applied physics, Vol. 54, No. 10, 108002, 01.10.2015.

Research output: Contribution to journal › Article › peer-review

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abstract = "Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.",

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AU - Hanada, Kenji

AU - Yoshitake, Tsuyoshi

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N2 - Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.

AB - Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.

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Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector

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