TY - JOUR
T1 - Detection methods of diamond diffraction peaks in ultrananocrystalline diamond/amorphous carbon composite films by X-ray diffraction measurement with semiconductor counter detector
AU - Hara, Takeshi
AU - Nojiri, Yoshihiro
AU - Hanada, Kenji
AU - Yoshitake, Tsuyoshi
N1 - Funding Information:
This research was financially supported by the Universiti Sains Islam Research Grant No. USIM/MG/YADIM/FKP/055012/70617
Publisher Copyright:
© 2015 The Japan Society of Applied Physics.
PY - 2015/10/1
Y1 - 2015/10/1
N2 - Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.
AB - Ultrananocrystalline diamond (UNCD)/amorphous carbon (a-C) composite films were fabricated by a coaxial arc plasma deposition (CAPD) method. Hereafter, UNCD with crystallite diameters of less than 10nm in an a-C matrix could only be unambiguously detected by powder X-ray diffraction measurement using a synchrotron radiation source (SR-XRD) or transmission electron microscopy (TEM) observation. In this study, we succeeded in detecting diffraction peaks due to diamond-111 in the film by X-ray diffraction (XRD) using a Cu-K? radiation source with a semiconductor counter detector. The obtained data were in agreement with the powder SR-XRD measurements of the deposited films.
UR - http://www.scopus.com/inward/record.url?scp=84943311840&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84943311840&partnerID=8YFLogxK
U2 - 10.7567/JJAP.54.108002
DO - 10.7567/JJAP.54.108002
M3 - Article
AN - SCOPUS:84943311840
VL - 54
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 10
M1 - 108002
ER -