Determination of strontium segregation in modified hypoeutectic Al-Si alloy by micro X-ray fluorescence analysis

K. Nogita, H. Yasuda, K. Yoshida, K. Uesugi, A. Takeuchi, Y. Suzuki, A. K. Dahle

Research output: Contribution to journalArticlepeer-review

87 Citations (Scopus)

Abstract

Analysis of intra- and inter-phase distribution of modifying elements in aluminium-silicon alloys is difficult due to the low concentrations used. This research utilises a μ-XRF (X-ray fluorescence) technique at the SPring-8 synchrotron radiation facility X-ray source and reveals that the modifying element strontium segregates exclusively to the eutectic silicon phase and the distribution of strontium within this phase is relatively homogeneous. This has important implications for the fundamental mechanisms of eutectic modification in hypoeutectic aluminium-silicon alloys.

Original languageEnglish
Pages (from-to)787-790
Number of pages4
JournalScripta Materialia
Volume55
Issue number9
DOIs
Publication statusPublished - Nov 1 2006

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

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