Determination of 16O and 18O sensitivity factors and charge-exchange processes in low-energy ion scattering

H. Téllez, R. J. Chater, S. Fearn, E. Symianakis, H. H. Brongersma, J. A. Kilner

    Research output: Contribution to journalArticlepeer-review

    11 Citations (Scopus)

    Abstract

    Quantitative analysis in low-energy ion scattering (LEIS) requires an understanding of the charge-exchange processes to estimate the elemental sensitivity factors. In this work, the neutralization of He scattered by 18O-exchanged silica at energies between 0.6 and 7 keV was studied. The process is dominated by Auger neutralization for E i 0.8 keV. An additional mechanism starts above the reionization threshold. This collision-induced neutralization becomes the dominant mechanism for E i > 2 keV. The ion fractions P were determined for Si and O using the characteristic velocity method to quantify the surface density. The 18O/ 16O sensitivity ratio indicates an 18 higher sensitivity for the heavier O isotope.

    Original languageEnglish
    Article number151602
    JournalApplied Physics Letters
    Volume101
    Issue number15
    DOIs
    Publication statusPublished - Oct 8 2012

    All Science Journal Classification (ASJC) codes

    • Physics and Astronomy (miscellaneous)

    Fingerprint Dive into the research topics of 'Determination of <sup>16</sup>O and <sup>18</sup>O sensitivity factors and charge-exchange processes in low-energy ion scattering'. Together they form a unique fingerprint.

    Cite this