Determination of the absorption-free kani factors for quantitative microanalysis of nickel base alloys

Zenji Horita, Takeshi Sano, Minoru Nemoto

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    14 Citations (Scopus)

    Abstract

    The extrapolation method is applied to the determination of the absorption free kANI factors, (kANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log kANI vs. tM and log kAN, vs. INI are observed for this determination, where tM Is the foil thickness measured by the contamination spot separation method and INI is the characteristic X-ray Intensity of NiKα. The theoretical KANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.

    Original languageEnglish
    Pages (from-to)324-334
    Number of pages11
    JournalMicroscopy
    Volume35
    Issue number4
    DOIs
    Publication statusPublished - 1986

    All Science Journal Classification (ASJC) codes

    • Structural Biology
    • Instrumentation
    • Radiology Nuclear Medicine and imaging

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