Abstract
The extrapolation method is applied to the determination of the absorption free kANI factors, (kANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log kANI vs. tM and log kAN, vs. INI are observed for this determination, where tM Is the foil thickness measured by the contamination spot separation method and INI is the characteristic X-ray Intensity of NiKα. The theoretical KANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.
| Original language | English |
|---|---|
| Pages (from-to) | 324-334 |
| Number of pages | 11 |
| Journal | Microscopy |
| Volume | 35 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - Jan 1 1986 |
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All Science Journal Classification (ASJC) codes
- Structural Biology
- Instrumentation
- Radiology Nuclear Medicine and imaging
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Determination of the absorption-free kani factors for quantitative microanalysis of nickel base alloys. / Horita, Zenji; Sano, Takeshi; Nemoto, Minoru.
In: Microscopy, Vol. 35, No. 4, 01.01.1986, p. 324-334.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Determination of the absorption-free kani factors for quantitative microanalysis of nickel base alloys
AU - Horita, Zenji
AU - Sano, Takeshi
AU - Nemoto, Minoru
PY - 1986/1/1
Y1 - 1986/1/1
N2 - The extrapolation method is applied to the determination of the absorption free kANI factors, (kANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log kANI vs. tM and log kAN, vs. INI are observed for this determination, where tM Is the foil thickness measured by the contamination spot separation method and INI is the characteristic X-ray Intensity of NiKα. The theoretical KANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.
AB - The extrapolation method is applied to the determination of the absorption free kANI factors, (kANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log kANI vs. tM and log kAN, vs. INI are observed for this determination, where tM Is the foil thickness measured by the contamination spot separation method and INI is the characteristic X-ray Intensity of NiKα. The theoretical KANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.
UR - http://www.scopus.com/inward/record.url?scp=84963056606&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84963056606&partnerID=8YFLogxK
U2 - 10.1093/oxfordjournals.jmicro.a050585
DO - 10.1093/oxfordjournals.jmicro.a050585
M3 - Article
AN - SCOPUS:84963056606
VL - 35
SP - 324
EP - 334
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
SN - 2050-5698
IS - 4
ER -