Determination of the absorption-free kani factors for quantitative microanalysis of nickel base alloys

Zenji Horita; Takeshi Sano; Minoru Nemoto

doi:10.1093/oxfordjournals.jmicro.a050585

Determination of the absorption-free k_ani factors for quantitative microanalysis of nickel base alloys

Zenji Horita, Takeshi Sano, Minoru Nemoto

Materials Processing

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

The extrapolation method is applied to the determination of the absorption free k_ANI factors, (k_ANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log k_ANI vs. t_M and log k_AN, vs. I_NI are observed for this determination, where t_M Is the foil thickness measured by the contamination spot separation method and I_NI is the characteristic X-ray Intensity of NiKα. The theoretical K_ANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.

Original language	English
Pages (from-to)	324-334
Number of pages	11
Journal	Microscopy
Volume	35
Issue number	4
DOIs	https://doi.org/10.1093/oxfordjournals.jmicro.a050585
Publication status	Published - 1986

All Science Journal Classification (ASJC) codes

Structural Biology
Instrumentation
Radiology Nuclear Medicine and imaging

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10.1093/oxfordjournals.jmicro.a050585

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title = "Determination of the absorption-free kani factors for quantitative microanalysis of nickel base alloys",

abstract = "The extrapolation method is applied to the determination of the absorption free kANI factors, (kANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log kANI vs. tM and log kAN, vs. INI are observed for this determination, where tM Is the foil thickness measured by the contamination spot separation method and INI is the characteristic X-ray Intensity of NiKα. The theoretical KANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.",

author = "Zenji Horita and Takeshi Sano and Minoru Nemoto",

note = "Funding Information: Acknowledgments. We are very grateful to Messrs. K. Sakamoto, W. H. Tian and H. Miyazaki for helpful cooperation. This research was supported partly by the Iron and Steel Institute of Japan.",

year = "1986",

doi = "10.1093/oxfordjournals.jmicro.a050585",

language = "English",

volume = "35",

pages = "324--334",

journal = "Microscopy (Oxford, England)",

issn = "2050-5698",

publisher = "Japanese Society of Microscopy",

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T1 - Determination of the absorption-free kani factors for quantitative microanalysis of nickel base alloys

AU - Horita, Zenji

AU - Sano, Takeshi

AU - Nemoto, Minoru

N1 - Funding Information: Acknowledgments. We are very grateful to Messrs. K. Sakamoto, W. H. Tian and H. Miyazaki for helpful cooperation. This research was supported partly by the Iron and Steel Institute of Japan.

PY - 1986

Y1 - 1986

N2 - The extrapolation method is applied to the determination of the absorption free kANI factors, (kANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log kANI vs. tM and log kAN, vs. INI are observed for this determination, where tM Is the foil thickness measured by the contamination spot separation method and INI is the characteristic X-ray Intensity of NiKα. The theoretical KANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.

AB - The extrapolation method is applied to the determination of the absorption free kANI factors, (kANI)0, in thin-film X-ray microanalysis where A=Al(Kα), Ti(Kα), Mo(Kα, Lα), Ta(Lα, Mα) and W(Lα, Mα). The relationships of log kANI vs. tM and log kAN, vs. INI are observed for this determination, where tM Is the foil thickness measured by the contamination spot separation method and INI is the characteristic X-ray Intensity of NiKα. The theoretical KANI factors are calculated to compare with the extrapolated values. The advantages of the extrapolation method and the practical conditions required for the method are described in detail.

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