Deuterium retention in Toughened, Fine-Grained Recrystallized Tungsten

M. Oya, K. Uekita, H. T. Lee, Y. Ohtsuka, Y. Ueda, H. Kurishita, A. Kreter, J. W. Coenen, V. Philipps, S. Brezinsek, A. Litnovsky, K. Sugiyama, Y. Torikai

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Abstract

Deuterium retention in Toughened, Fine-Grained Recrystallized W (TFGR W-1.1 wt%TiC) was studied, compared to pure W. D implantation was performed to a fluence of 1 × 1024m 2 at temperatures of 473-873 K, followed by TDS. It was found that D retention in TFGR W is higher than in pure W at all irradiation temperatures. Namely, at 673 K, D retention in TFGR W is six times higher than pure W. TDS spectrum of TFGR W irradiated at 573 Khas a large peak around ∼700 K with small shoulder up to ∼1100 K. In the case of D + He simultaneous irradiation, D retention is about 30% lower than for pure D. In addition, plasma exposure experiment was also conducted in TEXTOR, followed by NRA. Higher retention in TFGR W-1.1 wt%TiC could be attributed to high grain boundary diffusion (then trapping deeper into the bulk) and formation of TiD2.

Original languageEnglish
Pages (from-to)S1052-S1054
JournalJournal of Nuclear Materials
Volume438
Issue numberSUPPL
DOIs
Publication statusPublished - 2013

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Materials Science(all)
  • Nuclear Energy and Engineering

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    Oya, M., Uekita, K., Lee, H. T., Ohtsuka, Y., Ueda, Y., Kurishita, H., Kreter, A., Coenen, J. W., Philipps, V., Brezinsek, S., Litnovsky, A., Sugiyama, K., & Torikai, Y. (2013). Deuterium retention in Toughened, Fine-Grained Recrystallized Tungsten. Journal of Nuclear Materials, 438(SUPPL), S1052-S1054. https://doi.org/10.1016/j.jnucmat.2013.01.230