Development of a laser-guided deep small-sized hole-measurement system: Measurement accuracy

Akio Katsuki, Takao Sajima, Hiroshi Murakami, Ali Md Hazrat, Osamu Ohnishi, Kouji Akashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A measurement system for measuring a small-sized hole with a 17 to 21 mm diameter and 1 000 mm length was constructed. The constructed system consists of a measurement probe, a laser interferometer for detecting the roundness of a hole, and an optical system for detecting the probe position and inclination. The probe consists of a rotatable measurement unit with a pentaprism and corner cube prism, a DC motor for rotating the measurement unit, and a laser diode to radiate a laser beam toward the optical system. In this study, the measurement accuracy of the system is examined through a comparison with other measurement instruments. Further, factors causing measurement errors are analyzed and discussed. As a result, it is clear that a deviation of the probe from the center of the hole and the fabrication error of the probe adversely affect measurement accuracy. Further, small deviations lead to a decrease in measurement errors and a simplification of the measurement system.

Original languageEnglish
Title of host publicationProceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015
Publishereuspen
Pages201-202
Number of pages2
ISBN (Electronic)9780956679079
Publication statusPublished - 2015
Event15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015 - Leuven, Belgium
Duration: Jun 1 2015Jun 5 2015

Other

Other15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015
CountryBelgium
CityLeuven
Period6/1/156/5/15

Fingerprint

Lasers
lasers
Units of measurement
Measurement errors
Optical systems
probes
DC motors
Prisms
Interferometers
Laser beams
Semiconductor lasers
deviation
Fabrication
simplification
prisms
inclination
interferometers
direct current
semiconductor lasers
laser beams

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Industrial and Manufacturing Engineering
  • Mechanical Engineering
  • Instrumentation
  • Environmental Engineering

Cite this

Katsuki, A., Sajima, T., Murakami, H., Hazrat, A. M., Ohnishi, O., & Akashi, K. (2015). Development of a laser-guided deep small-sized hole-measurement system: Measurement accuracy. In Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015 (pp. 201-202). euspen.

Development of a laser-guided deep small-sized hole-measurement system : Measurement accuracy. / Katsuki, Akio; Sajima, Takao; Murakami, Hiroshi; Hazrat, Ali Md; Ohnishi, Osamu; Akashi, Kouji.

Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015. euspen, 2015. p. 201-202.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Katsuki, A, Sajima, T, Murakami, H, Hazrat, AM, Ohnishi, O & Akashi, K 2015, Development of a laser-guided deep small-sized hole-measurement system: Measurement accuracy. in Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015. euspen, pp. 201-202, 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015, Leuven, Belgium, 6/1/15.
Katsuki A, Sajima T, Murakami H, Hazrat AM, Ohnishi O, Akashi K. Development of a laser-guided deep small-sized hole-measurement system: Measurement accuracy. In Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015. euspen. 2015. p. 201-202
Katsuki, Akio ; Sajima, Takao ; Murakami, Hiroshi ; Hazrat, Ali Md ; Ohnishi, Osamu ; Akashi, Kouji. / Development of a laser-guided deep small-sized hole-measurement system : Measurement accuracy. Proceedings of the 15th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2015. euspen, 2015. pp. 201-202
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