TY - JOUR
T1 - Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography
AU - Sato, K.
AU - Miyazaki, H.
AU - Gondo, T.
AU - Miyazaki, S.
AU - Murayama, M.
AU - Hata, S.
N1 - Publisher Copyright:
© The Author 2015.
PY - 2015/10
Y1 - 2015/10
N2 - We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10−6 and 5.2 × 10−3 s−1. We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as ‘straining and tomography holder’, will have wide range potential applications in materials science.
AB - We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10−6 and 5.2 × 10−3 s−1. We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as ‘straining and tomography holder’, will have wide range potential applications in materials science.
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U2 - 10.1093/jmicro/dfv021
DO - 10.1093/jmicro/dfv021
M3 - Article
AN - SCOPUS:84947794366
SN - 2050-5698
VL - 64
SP - 369
EP - 375
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
IS - 5
ER -