Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography

K. Sato, H. Miyazaki, T. Gondo, S. Miyazaki, M. Murayama, Satoshi Hata

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We have developed a newly designed straining specimen holder for in situ transmission electron microscopy (TEM) compatible with high-angle single tilt-axis electron tomography. The holder can deform a TEM specimen under tensile stress with the strain rate between 1.5 × 10−6 and 5.2 × 10−3 s−1. We have also confirmed that the maximum tilt angle of the specimen holder reaches ±60° with a rectangular shape aluminum specimen. The new specimen holder, termed as ‘straining and tomography holder’, will have wide range potential applications in materials science.

Original languageEnglish
Pages (from-to)369-375
Number of pages7
JournalMicroscopy
Volume64
Issue number5
DOIs
Publication statusPublished - Oct 1 2015

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Electron Microscope Tomography
holders
Transmission Electron Microscopy
Tomography
tomography
Transmission electron microscopy
transmission electron microscopy
Electrons
Materials science
Aluminum
Tensile stress
Strain rate
electrons
materials science
tensile stress
strain rate
aluminum

All Science Journal Classification (ASJC) codes

  • Structural Biology
  • Instrumentation
  • Radiology Nuclear Medicine and imaging

Cite this

Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. / Sato, K.; Miyazaki, H.; Gondo, T.; Miyazaki, S.; Murayama, M.; Hata, Satoshi.

In: Microscopy, Vol. 64, No. 5, 01.10.2015, p. 369-375.

Research output: Contribution to journalArticle

Sato, K. ; Miyazaki, H. ; Gondo, T. ; Miyazaki, S. ; Murayama, M. ; Hata, Satoshi. / Development of a novel straining holder for transmission electron microscopy compatible with single tilt-axis electron tomography. In: Microscopy. 2015 ; Vol. 64, No. 5. pp. 369-375.
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