Development of a nuclear reaction database on silicon for simulation of neutron-induced single-event upsets in microelectronics and its application

Yukinobu Watanabe, Akihiro Kodama, Yasuyuki Tukamoto, Hideki Nakashima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

We have developed a cross-section database for neutron-induced reactions on 28Si in the energy range between 2 MeV and 3 GeV in order to analyze single-event upsets (SEUs) phenomena induced by cosmic-ray neutrons in microelectronic devices. A simplified spherical device model is proposed for simulation of the initial processes of SEUs. The model is applied to SEU cross-section calculations for semiconductor memory devices. The calculated results are compared with measured SEU cross sections and the other simulation result. The dependence of SEU cross sections on incident neutron energy and secondary ions having the most important effects on SEUs are discussed.

Original languageEnglish
Title of host publicationInternational Conference on Nuclear Data for Science and Technology
Pages1646-1649
Number of pages4
DOIs
Publication statusPublished - May 24 2005
EventInternational Conference on Nuclear Data for Science and Technology - Santa Fe, NM, United States
Duration: Sep 26 2004Oct 1 2004

Publication series

NameAIP Conference Proceedings
Volume769
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherInternational Conference on Nuclear Data for Science and Technology
CountryUnited States
CitySanta Fe, NM
Period9/26/0410/1/04

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Watanabe, Y., Kodama, A., Tukamoto, Y., & Nakashima, H. (2005). Development of a nuclear reaction database on silicon for simulation of neutron-induced single-event upsets in microelectronics and its application. In International Conference on Nuclear Data for Science and Technology (pp. 1646-1649). (AIP Conference Proceedings; Vol. 769). https://doi.org/10.1063/1.1945323