Development of an adaptive optical system for sub-10-nm focusing of synchrotron radiation hard X-rays

H. Mimura, Takashi Kimura, H. Yokoyama, H. Yumoto, S. Matsuyama, K. Tamasaku, Y. Koumura, M. Yabashi, T. Ishikawa, K. Yamauchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

In the hard x-ray region, to obtain the theoretical resolution or diffraction-limited focusing size in an imaging optical system, both ultraprecise optics and highly accurate alignment are necessary. An adaptive optical system is used for the compensation of aberrations in various optical systems, such as optical microscopes and space telescopes. In situ wavefront control of hard x-rays is also effective for realizing ideal performance. The aim of this paper is to develop an adaptive optical system for sub-10-nm hard x-ray focusing. The adaptive optical system performs the wavefront measurement using a phase retrieval algorithm and wavefront control using grazing-incidence deformable mirrors. Several results of experiments using the developed system are reported.

Original languageEnglish
Title of host publication10th International Conference on X-Ray Microscopy
Pages13-17
Number of pages5
DOIs
Publication statusPublished - Dec 1 2010
Externally publishedYes
Event10th International Conference on X-Ray Microscopy - Chicago, IL, United States
Duration: Aug 15 2010Aug 20 2010

Publication series

NameAIP Conference Proceedings
Volume1365
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other10th International Conference on X-Ray Microscopy
CountryUnited States
CityChicago, IL
Period8/15/108/20/10

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All Science Journal Classification (ASJC) codes

  • Ecology, Evolution, Behavior and Systematics
  • Ecology
  • Plant Science
  • Physics and Astronomy(all)
  • Nature and Landscape Conservation

Cite this

Mimura, H., Kimura, T., Yokoyama, H., Yumoto, H., Matsuyama, S., Tamasaku, K., ... Yamauchi, K. (2010). Development of an adaptive optical system for sub-10-nm focusing of synchrotron radiation hard X-rays. In 10th International Conference on X-Ray Microscopy (pp. 13-17). (AIP Conference Proceedings; Vol. 1365). https://doi.org/10.1063/1.3625294