Development of an advanced low-energy electron diffraction technique using field-emitted electrons from scanning tunneling microscope tips

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    Abstract

    The demonstration of a prototype instrument was presented which employed a new technique for determination of surface structures. The instrument consisted of a detector for projecting electron scattering patterns and a scanning tunneling microscope (STM) tip as a field emission gun. The tips operation under a field emission condition with 14 - 50 V bias voltages made it possible to observe the electron scattering patterns. Comparison of the experimentally obtained patterns was done with calculated results showing close correlation, signifying that the obtained patterns were caused by the electrons scattered on a sample surface after emission from a STM tip.

    Original languageEnglish
    Pages (from-to)1874-1878
    Number of pages5
    JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
    Volume19
    Issue number5
    DOIs
    Publication statusPublished - Sep 2001

    All Science Journal Classification (ASJC) codes

    • Condensed Matter Physics
    • Electrical and Electronic Engineering

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