The demonstration of a prototype instrument was presented which employed a new technique for determination of surface structures. The instrument consisted of a detector for projecting electron scattering patterns and a scanning tunneling microscope (STM) tip as a field emission gun. The tips operation under a field emission condition with 14 - 50 V bias voltages made it possible to observe the electron scattering patterns. Comparison of the experimentally obtained patterns was done with calculated results showing close correlation, signifying that the obtained patterns were caused by the electrons scattered on a sample surface after emission from a STM tip.
|Number of pages||5|
|Journal||Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures|
|Publication status||Published - Sep 2001|
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Electrical and Electronic Engineering