Development of an ultra-high performance multi-turn TOF-SIMS/SNMS system "mULTUM-SIMS/SNMS"

Shingo Ebata, Morio Ishihara, Kousuke Kumondai, Ryo Mibuka, Kiichiro Uchino, Hisayoshi Yurimoto

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Abstract

A new system incorporating a multi-turn time-of-flight secondary ion/sputtered neutral mass spectrometer (TOF-SIMS/SNMS) with laser post-ionization was designed and constructed. This system consists of a gallium focused ion beam, femtosecond (fs) laser for post-ionization, and multi-turn TOF mass spectrometer. When laser post-ionization was used, the secondary ion signal strengths for several metals increased by up to 650 times, and were greater than the values obtained in conventional TOF-SIMS experiments. Use of the multi-turn mass spectrometer resulted in an increase in mass resolving power with increase in the total TOF. The mass resolving power reached to 23,000 after 800 multi-turn cycles, corresponding to a flight path length of 1040 m. These results indicated that this system is very effective for the analysis of valuable materials such as space samples with high sensitivity, high mass resolving power, and high lateral resolution. [Figure not available: see fulltext.]

Original languageEnglish
Pages (from-to)222-229
Number of pages8
JournalJournal of the American Society for Mass Spectrometry
Volume24
Issue number2
DOIs
Publication statusPublished - Feb 1 2013

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All Science Journal Classification (ASJC) codes

  • Structural Biology
  • Spectroscopy

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