Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation

Y. Ueda; T. Uchino; D. Ishi; Y. Ezoe; K. Ishikawa; M. Numazawa; A. Fukushima; S. Sakuda; A. Inagaki; H. Morishita; L. Sekiguchi; T. Murakawa; Y. Tsuji; K. Mitsuda; K. Morishita; K. Nakajima

doi:10.1117/12.2629635

Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation

Y. Ueda, T. Uchino, D. Ishi, Y. Ezoe, K. Ishikawa, M. Numazawa, A. Fukushima, S. Sakuda, A. Inagaki, H. Morishita, L. Sekiguchi, T. Murakawa, Y. Tsuji, K. Mitsuda, K. Morishita, K. Nakajima

Metals Science for Structural Materials

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We are developing a novel Bragg reflection X-ray polarimeter using hot plastic deformation of silicon wafers. A Bragg reflection polarimeter has the advantage of simple principle and large modulation factor but suffers from the disadvantage of a narrow detectable energy band and difficulty to focus an incident beam. We overcome these disadvantages by bending a silicon wafer at high temperature. The bent Bragg reflection polarimeter have a wide energy band using different angles on the wafer and enable focusing. We have succeeded in measuring X-ray polarization with this method for the first time using a sample optic made from a 4-inch silicon (100) wafer.

Original language	English
Title of host publication	Space Telescopes and Instrumentation 2022
Subtitle of host publication	Ultraviolet to Gamma Ray
Editors	Jan-Willem A. den Herder, Shouleh Nikzad, Kazuhiro Nakazawa
Publisher	SPIE
ISBN (Electronic)	9781510653436
DOIs	https://doi.org/10.1117/12.2629635
Publication status	Published - 2022
Event	Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray - Montreal, United States Duration: Jul 17 2022 → Jul 22 2022

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	12181
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray
Country/Territory	United States
City	Montreal
Period	7/17/22 → 7/22/22

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2629635

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Ueda, Y., Uchino, T., Ishi, D., Ezoe, Y., Ishikawa, K., Numazawa, M., Fukushima, A., Sakuda, S., Inagaki, A., Morishita, H., Sekiguchi, L., Murakawa, T., Tsuji, Y., Mitsuda, K., Morishita, K., & Nakajima, K. (2022). Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation. In J-W. A. den Herder, S. Nikzad, & K. Nakazawa (Eds.), Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray [121812O] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 12181). SPIE. https://doi.org/10.1117/12.2629635

Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation. / Ueda, Y.; Uchino, T.; Ishi, D. et al.

Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray. ed. / Jan-Willem A. den Herder; Shouleh Nikzad; Kazuhiro Nakazawa. SPIE, 2022. 121812O (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 12181).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ueda, Y, Uchino, T, Ishi, D, Ezoe, Y, Ishikawa, K, Numazawa, M, Fukushima, A, Sakuda, S, Inagaki, A, Morishita, H, Sekiguchi, L, Murakawa, T, Tsuji, Y, Mitsuda, K, Morishita, K & Nakajima, K 2022, Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation. in J-WA den Herder, S Nikzad & K Nakazawa (eds), Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray., 121812O, Proceedings of SPIE - The International Society for Optical Engineering, vol. 12181, SPIE, Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray, Montreal, United States, 7/17/22. https://doi.org/10.1117/12.2629635

Ueda Y, Uchino T, Ishi D, Ezoe Y, Ishikawa K, Numazawa M et al. Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation. In den Herder J-WA, Nikzad S, Nakazawa K, editors, Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray. SPIE. 2022. 121812O. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2629635

Ueda, Y. ; Uchino, T. ; Ishi, D. et al. / Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation. Space Telescopes and Instrumentation 2022: Ultraviolet to Gamma Ray. editor / Jan-Willem A. den Herder ; Shouleh Nikzad ; Kazuhiro Nakazawa. SPIE, 2022. (Proceedings of SPIE - The International Society for Optical Engineering).

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AU - Ezoe, Y.

AU - Ishikawa, K.

AU - Numazawa, M.

AU - Fukushima, A.

AU - Sakuda, S.

AU - Inagaki, A.

AU - Morishita, H.

AU - Sekiguchi, L.

AU - Murakawa, T.

AU - Tsuji, Y.

AU - Mitsuda, K.

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AU - Nakajima, K.

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AB - We are developing a novel Bragg reflection X-ray polarimeter using hot plastic deformation of silicon wafers. A Bragg reflection polarimeter has the advantage of simple principle and large modulation factor but suffers from the disadvantage of a narrow detectable energy band and difficulty to focus an incident beam. We overcome these disadvantages by bending a silicon wafer at high temperature. The bent Bragg reflection polarimeter have a wide energy band using different angles on the wafer and enable focusing. We have succeeded in measuring X-ray polarization with this method for the first time using a sample optic made from a 4-inch silicon (100) wafer.

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Development of Bragg reflection-type X-ray polarimeter based on a bent silicon crystal using hot plastic deformation

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