Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals

Hiroyuki Toda, Darren Leclere, Takanobu Kamiko, Yoshio Suzuki, Akihisa Takeuchi, Kentaro Uesugi, Masakazu Kobayashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

By amalgamating a transmission X-Ray diffraction (XRD) experiment with grain boundary tracking (GBT) that has been developed by the present authors by combining the X-ray micro-tomography (CT) and the gallium-enhanced grain boundary visualization techniques, a novel method which provides accurate crystallographic information of individual grains during deformation has been created. The developed technique, which is called diffraction-amalgamated grain boundary tracking (DAGT) technique, is non-destructive for in-situ characterizing of bulk materials, which allows for close to deformation and fracture analysis of metals. Employing near field XRD analysis with a thin collimated X-ray beam, the algorithms developed for DAGT identifies which diffraction spots are related to which grain; consequently, providing a description of the misorientation between grains. DAGT also realizes micron-level analysis of grain morphologies and local stain distribution in 3-dimensions (3D) on the basis of CT observation, enabling the crystallographic interpretation of localized deformation without being affected by blurring of diffraction spots caused by deformation. An Al-3mass%Cu alloy was used for demonstration purpose.

Original languageEnglish
Title of host publicationDevelopments in X-Ray Tomography VIII
DOIs
Publication statusPublished - Dec 1 2012
Externally publishedYes
EventDevelopments in X-Ray Tomography VIII - San Diego, CA, United States
Duration: Aug 13 2012Aug 15 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8506
ISSN (Print)0277-786X

Other

OtherDevelopments in X-Ray Tomography VIII
CountryUnited States
CitySan Diego, CA
Period8/13/128/15/12

Fingerprint

Grain Boundary
Diffraction
Grain boundaries
grain boundaries
Metals
diffraction
metals
X-ray Diffraction
Microtomography
X rays
Gallium
x rays
Near-field
X ray diffraction analysis
Tomography
blurring
Coloring Agents
Demonstrations
Visualization
misalignment

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Toda, H., Leclere, D., Kamiko, T., Suzuki, Y., Takeuchi, A., Uesugi, K., & Kobayashi, M. (2012). Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals. In Developments in X-Ray Tomography VIII [85060B] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8506). https://doi.org/10.1117/12.930608

Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals. / Toda, Hiroyuki; Leclere, Darren; Kamiko, Takanobu; Suzuki, Yoshio; Takeuchi, Akihisa; Uesugi, Kentaro; Kobayashi, Masakazu.

Developments in X-Ray Tomography VIII. 2012. 85060B (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8506).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Toda, H, Leclere, D, Kamiko, T, Suzuki, Y, Takeuchi, A, Uesugi, K & Kobayashi, M 2012, Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals. in Developments in X-Ray Tomography VIII., 85060B, Proceedings of SPIE - The International Society for Optical Engineering, vol. 8506, Developments in X-Ray Tomography VIII, San Diego, CA, United States, 8/13/12. https://doi.org/10.1117/12.930608
Toda H, Leclere D, Kamiko T, Suzuki Y, Takeuchi A, Uesugi K et al. Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals. In Developments in X-Ray Tomography VIII. 2012. 85060B. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.930608
Toda, Hiroyuki ; Leclere, Darren ; Kamiko, Takanobu ; Suzuki, Yoshio ; Takeuchi, Akihisa ; Uesugi, Kentaro ; Kobayashi, Masakazu. / Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals. Developments in X-Ray Tomography VIII. 2012. (Proceedings of SPIE - The International Society for Optical Engineering).
@inproceedings{8a3a8b8e5aee4a909d7f407e322eee9d,
title = "Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals",
abstract = "By amalgamating a transmission X-Ray diffraction (XRD) experiment with grain boundary tracking (GBT) that has been developed by the present authors by combining the X-ray micro-tomography (CT) and the gallium-enhanced grain boundary visualization techniques, a novel method which provides accurate crystallographic information of individual grains during deformation has been created. The developed technique, which is called diffraction-amalgamated grain boundary tracking (DAGT) technique, is non-destructive for in-situ characterizing of bulk materials, which allows for close to deformation and fracture analysis of metals. Employing near field XRD analysis with a thin collimated X-ray beam, the algorithms developed for DAGT identifies which diffraction spots are related to which grain; consequently, providing a description of the misorientation between grains. DAGT also realizes micron-level analysis of grain morphologies and local stain distribution in 3-dimensions (3D) on the basis of CT observation, enabling the crystallographic interpretation of localized deformation without being affected by blurring of diffraction spots caused by deformation. An Al-3mass{\%}Cu alloy was used for demonstration purpose.",
author = "Hiroyuki Toda and Darren Leclere and Takanobu Kamiko and Yoshio Suzuki and Akihisa Takeuchi and Kentaro Uesugi and Masakazu Kobayashi",
year = "2012",
month = "12",
day = "1",
doi = "10.1117/12.930608",
language = "English",
isbn = "9780819492234",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Developments in X-Ray Tomography VIII",

}

TY - GEN

T1 - Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals

AU - Toda, Hiroyuki

AU - Leclere, Darren

AU - Kamiko, Takanobu

AU - Suzuki, Yoshio

AU - Takeuchi, Akihisa

AU - Uesugi, Kentaro

AU - Kobayashi, Masakazu

PY - 2012/12/1

Y1 - 2012/12/1

N2 - By amalgamating a transmission X-Ray diffraction (XRD) experiment with grain boundary tracking (GBT) that has been developed by the present authors by combining the X-ray micro-tomography (CT) and the gallium-enhanced grain boundary visualization techniques, a novel method which provides accurate crystallographic information of individual grains during deformation has been created. The developed technique, which is called diffraction-amalgamated grain boundary tracking (DAGT) technique, is non-destructive for in-situ characterizing of bulk materials, which allows for close to deformation and fracture analysis of metals. Employing near field XRD analysis with a thin collimated X-ray beam, the algorithms developed for DAGT identifies which diffraction spots are related to which grain; consequently, providing a description of the misorientation between grains. DAGT also realizes micron-level analysis of grain morphologies and local stain distribution in 3-dimensions (3D) on the basis of CT observation, enabling the crystallographic interpretation of localized deformation without being affected by blurring of diffraction spots caused by deformation. An Al-3mass%Cu alloy was used for demonstration purpose.

AB - By amalgamating a transmission X-Ray diffraction (XRD) experiment with grain boundary tracking (GBT) that has been developed by the present authors by combining the X-ray micro-tomography (CT) and the gallium-enhanced grain boundary visualization techniques, a novel method which provides accurate crystallographic information of individual grains during deformation has been created. The developed technique, which is called diffraction-amalgamated grain boundary tracking (DAGT) technique, is non-destructive for in-situ characterizing of bulk materials, which allows for close to deformation and fracture analysis of metals. Employing near field XRD analysis with a thin collimated X-ray beam, the algorithms developed for DAGT identifies which diffraction spots are related to which grain; consequently, providing a description of the misorientation between grains. DAGT also realizes micron-level analysis of grain morphologies and local stain distribution in 3-dimensions (3D) on the basis of CT observation, enabling the crystallographic interpretation of localized deformation without being affected by blurring of diffraction spots caused by deformation. An Al-3mass%Cu alloy was used for demonstration purpose.

UR - http://www.scopus.com/inward/record.url?scp=84872555145&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84872555145&partnerID=8YFLogxK

U2 - 10.1117/12.930608

DO - 10.1117/12.930608

M3 - Conference contribution

AN - SCOPUS:84872555145

SN - 9780819492234

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Developments in X-Ray Tomography VIII

ER -