Development of double-probe piezo-driving holder for TEM

K. Yamazaki, I. Ishikawa, S. Deguchi, Y. Kondo, Yasukazu Murakami, D. Shindo

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)814-815
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
Publication statusPublished - Aug 1 2008

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holders
Transmission electron microscopy
transmission electron microscopy
probes

All Science Journal Classification (ASJC) codes

  • Instrumentation

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Yamazaki, K., Ishikawa, I., Deguchi, S., Kondo, Y., Murakami, Y., & Shindo, D. (2008). Development of double-probe piezo-driving holder for TEM. Microscopy and Microanalysis, 14(SUPPL. 2), 814-815. https://doi.org/10.1017/S1431927608083165

Development of double-probe piezo-driving holder for TEM. / Yamazaki, K.; Ishikawa, I.; Deguchi, S.; Kondo, Y.; Murakami, Yasukazu; Shindo, D.

In: Microscopy and Microanalysis, Vol. 14, No. SUPPL. 2, 01.08.2008, p. 814-815.

Research output: Contribution to journalArticle

Yamazaki, K, Ishikawa, I, Deguchi, S, Kondo, Y, Murakami, Y & Shindo, D 2008, 'Development of double-probe piezo-driving holder for TEM', Microscopy and Microanalysis, vol. 14, no. SUPPL. 2, pp. 814-815. https://doi.org/10.1017/S1431927608083165
Yamazaki, K. ; Ishikawa, I. ; Deguchi, S. ; Kondo, Y. ; Murakami, Yasukazu ; Shindo, D. / Development of double-probe piezo-driving holder for TEM. In: Microscopy and Microanalysis. 2008 ; Vol. 14, No. SUPPL. 2. pp. 814-815.
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