TY - JOUR
T1 - Development of hard X-ray and gamma-ray spectrometer using superconducting transition edge sensor
AU - Hatakeyama, Shuichi
AU - Ohno, Masashi
AU - Damayanthi, R. M.Thushara
AU - Takahashi, Hiroyuki
AU - Kuno, Yusuke
AU - Iyomoto, Naoko
AU - Maehata, Keisuke
AU - Otani, Chiko
AU - Usui, Toshihide
AU - Onishi, Takashi
AU - Obayashi, Hiroshi
AU - Takasaki, Koji
N1 - Funding Information:
This work has been financially supported by the project of Japan Science and Technology Agency (JST) "Development of systems and technology for advanced measurement and analysis".
PY - 2013/8
Y1 - 2013/8
N2 - Superconducting transition edge sensors (TES) are used for high-resolution X-ray spectroscopy. In our group, we developed an Ir-TES and reported an energy resolution of 6.9 eV FWHM at 5.9 keV (Kunieda et al., 2004). In this study, we have designed a new TES detector using a superconducting tin (Sn) absorber to detect high energy photons over 100 keV. The Sn absorber is coupled to an Ir/Au superconducting film which is deposited on an ultra-thin SiN membrane (500 nm thick) with a small amount of epoxy post (Stycast 2850FT) by handling with a flip-chip bonding machine. The measured energy resolution is 485 eV FWHM at 60 keV and is better than that of HPGe detector.
AB - Superconducting transition edge sensors (TES) are used for high-resolution X-ray spectroscopy. In our group, we developed an Ir-TES and reported an energy resolution of 6.9 eV FWHM at 5.9 keV (Kunieda et al., 2004). In this study, we have designed a new TES detector using a superconducting tin (Sn) absorber to detect high energy photons over 100 keV. The Sn absorber is coupled to an Ir/Au superconducting film which is deposited on an ultra-thin SiN membrane (500 nm thick) with a small amount of epoxy post (Stycast 2850FT) by handling with a flip-chip bonding machine. The measured energy resolution is 485 eV FWHM at 60 keV and is better than that of HPGe detector.
UR - http://www.scopus.com/inward/record.url?scp=84880917753&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84880917753&partnerID=8YFLogxK
U2 - 10.1016/j.radmeas.2012.05.013
DO - 10.1016/j.radmeas.2012.05.013
M3 - Article
AN - SCOPUS:84880917753
VL - 55
SP - 83
EP - 86
JO - Radiation Measurements
JF - Radiation Measurements
SN - 1350-4487
ER -