Development of specimen holders for measuring electrical properties of oxides under electron irradiation in HVEM

K. Shiiyama, C. Kinoshita, H. Suzuki, T. Izu, M. Kutsuwada, S. Matsumura

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Two types of specimen holders have been developed for in situ measurements of electrical properties during microstructural observation in a high voltage electron microscope (HVEM). Each specimen holder contains an electrode cell consisting of electrodes, a heater, a thermocouple and a base made from MACOR insulating ceramic. The temperature dependence of the electrical conductivity in ZrO2-3mol% Y2O3 (YSZ) and the dielectric loss in MgO have been investigated without irradiation for evaluating the reliability and the limitation of the specimen holders. YSZ specimens were irradiated with 1 MeV electrons at temperatures from 450 K to 870 K in the HVEM. The radiation induced electrical conductivity was detected by in situ measurements. The dielectric loss in MgO was also measured and found to increase under electron irradiation.

Original languageEnglish
Pages (from-to)284-287
Number of pages4
JournalNuclear Inst. and Methods in Physics Research, B
Issue number1-4
Publication statusPublished - Jun 1 1994


All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

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