Abstract
An x-ray microcalorimeter is a promising x-ray spectrometer for its extremely good energy resolution and its good detecting efficiency. We are developing an x-ray microcalorimeter for high energy resolution x-ray imaging application. The energy resolution of 43eV(FWHM) at 5.9keV is obtained with our x-ray microcalorimeter. The intrinsic performance of our x-ray microcalorimeter was estimated to be 10.4eV(FWHM) at 5.9keV. This value is more than 10 times better than that of the conventional x-ray CCD.
Original language | English |
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Title of host publication | 2003 Nanotechnology Conference and Trade Show - Nanotech 2003 |
Editors | M. Laudon, B. Romanowicz |
Pages | 436-439 |
Number of pages | 4 |
Volume | 1 |
Publication status | Published - Dec 1 2003 |
Externally published | Yes |
Event | 2003 Nanotechnology Conference and Trade Show - Nanotech 2003 - San Francisco, CA, United States Duration: Feb 23 2003 → Feb 27 2003 |
Other
Other | 2003 Nanotechnology Conference and Trade Show - Nanotech 2003 |
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Country/Territory | United States |
City | San Francisco, CA |
Period | 2/23/03 → 2/27/03 |
All Science Journal Classification (ASJC) codes
- Engineering(all)