Development of the nano-probe system based on the laser-trapping technique

M. Michihata, Y. Takaya, T. Hayashi

Research output: Contribution to journalArticle

55 Citations (Scopus)

Abstract

A nano-coordinate measuring machine (CMM) has been developed to achieve a measuring accuracy of 50 nm and a measuring volume of (10 mm)3. To meet these stringent requirements, a laser-trapping probe is employed as a nano-sensing probe. This paper describes the development of the nano-CMM system with a laser-trapping probe and describes the performance of the probe via an assessment of the flatness and microsphere. It is observed that the laser-trapping probe can sense three-dimensional objects with a repeatability of 32 nm. Using the nano-CMM, the measurement uncertainty is estimated to be 335 nm (k = 2).

Original languageEnglish
Pages (from-to)493-496
Number of pages4
JournalCIRP Annals - Manufacturing Technology
Volume57
Issue number1
DOIs
Publication statusPublished - May 9 2008
Externally publishedYes

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

Cite this