Development of total internal reflection raman microscope with an apparatus for adhesion test and changes in depolarization ratio of polymer brush by compressive force

Saburo Yamamoto, Tatsuya Kubozono, Ken Kojio, Atsushi Takahara

Research output: Contribution to journalArticle

Abstract

A new total internal reflection (TIR) Raman microscope that can be used for adhesion testing based on the Johnson-Kendall-Roberts (JKR) theory was developed. The angle and the focus of the laser beam can be accurately controlled by observing the image of the laser spot on a CCD camera in the spectrometer. As a result, strong Raman signals were obtained. It was observed that the depolarization ratio of polymer brushes changes with the compressive force. This equipment is useful for the analysis of the interface and the anisotropic structure of polymer thin films.

Original languageEnglish
Pages (from-to)673-680
Number of pages8
JournalKOBUNSHI RONBUNSHU
Volume72
Issue number11
DOIs
Publication statusPublished - Jan 1 2015

All Science Journal Classification (ASJC) codes

  • Chemical Engineering (miscellaneous)
  • Materials Science (miscellaneous)
  • Environmental Science(all)
  • Polymers and Plastics

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