Diffuse X-ray scattering study of sublattice ordering among group III atoms in In0.5Ga0.5P and In0.5Al0.5P

S. Yasuami, K. Koga, K. Ohshima, S. Sasaki, M. Ando

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7 Citations (Scopus)

Abstract

The intensity of superstructure reflections and associated diffuse scattering from In0.5Ga0.5P and In0.5Al0.5P epitaxic layers grown on (001) GaAs substrates was mapped in reciprocal space. The Warren-Cowley short-range-order parameters were obtained through the usual process for evaluating Fourier coefficients. Varying values for the correlation length in different directions indicate how group III atoms stack up in ordered states. The resultant structure with long-range order confirms the hypothesis made on the basis of electron diffraction and high-resolution transmission electron microscopy studies.

Original languageEnglish
Pages (from-to)514-518
Number of pages5
JournalJournal of Applied Crystallography
Volume25
Issue numberpt 4
DOIs
Publication statusPublished - Aug 1 1992

All Science Journal Classification (ASJC) codes

  • Biochemistry, Genetics and Molecular Biology(all)

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