Direct characterization of grain-boundary electrical activity in doped (Ba0.6Sr0.4)TiO3 by combined imaging of electron-beam-induced current and electron-backscattered diffraction

Katsuro Hayashi, Takahisa Yamamoto, Yuichi Ikuhara, Taketo Sakuma

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Simultaneous measurements of remote electron beam induced current (REBIC) and orientation imaging microscopy (OIM) in a scanning electron microscope (SEM) have been applied to a polycrystalline (Ba0.6Sr0.4)TiO3 with a positive temperature coefficient of resistivity (PTCR) to elucidate a grain-boundary character dependence of the potential barrier formation. The absence of electrical activity in a coherent Σ3 twin boundary is clearly imaged. The resistivity of individual grain boundaries estimated from a resistive contrast image is interpreted in terms of geometrical coherency, which is defined by the degree of coincidence in the reciprocal lattice points.

Original languageEnglish
Pages (from-to)1153-1156
Number of pages4
JournalJournal of the American Ceramic Society
Volume87
Issue number6
DOIs
Publication statusPublished - Jan 1 2004
Externally publishedYes

Fingerprint

Induced currents
grain boundary
Electron diffraction
diffraction
electrical resistivity
Electron beams
Grain boundaries
Positive temperature coefficient
Imaging techniques
electron
microscopy
Microscopic examination
Electron microscopes
Scanning
temperature

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Geology
  • Geochemistry and Petrology
  • Materials Chemistry

Cite this

Direct characterization of grain-boundary electrical activity in doped (Ba0.6Sr0.4)TiO3 by combined imaging of electron-beam-induced current and electron-backscattered diffraction. / Hayashi, Katsuro; Yamamoto, Takahisa; Ikuhara, Yuichi; Sakuma, Taketo.

In: Journal of the American Ceramic Society, Vol. 87, No. 6, 01.01.2004, p. 1153-1156.

Research output: Contribution to journalArticle

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