Dislocation configurations near a crack tip and its influence on the fracture toughness in silicon crystals

Masaki Tanaka, Kenji Higashida

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Dislocations emitted from a crack tip in silicon single crystals have been investigated using a high voltage electron microscopy (HVEM). The influence of those crack tip dislocations on the fracture toughness has been discussed based on the 3-D stress analysis of crack-dislocation interaction. Pure screw dislocations were introduced not only ahead of a crack tip but also behind the tip. The dislocations ahead of the crack tip have the sign of Burgers vectors opposite to that of the dislocations behind the tip. These configurations of crack tip dislocations are understood by dislocation loop expansion from sources near the crack tip. The contribution to the fracture toughness by those crack tip dislocations was calculated, and it was found that 70-90% increase in the fracture toughness was caused by a dislocation configuration corresponding to that observed in the early stage of dislocation emission from a crack tip.

Original languageEnglish
Pages (from-to)1505-1512
Number of pages8
JournalNippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A
Volume68
Issue number11
DOIs
Publication statusPublished - Nov 2002
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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