TY - JOUR
T1 - Dispersion relations for coupled surface plasmon-polariton modes excited in multilayer structures
AU - Saito, Hikaru
AU - Namura, Kyoko
AU - Suzuki, Motofumi
AU - Kurata, Hiroki
N1 - Publisher Copyright:
© The Author 2013. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved.
PY - 2014/2
Y1 - 2014/2
N2 - The coupled surface plasmon-polariton (SPP) modes excited in an Al/SiO2/ Al multilayer structure were analyzed using angle-resolved electron energy-loss spectroscopy (AREELS) with a relativistic electron probe. The dispersion relations for the coupled SPP modes were then directly observed and compared with predicted relations obtained via calculations. Good agreement was noted between the experimental and calculated results. In the multilayer structures, the dispersion relation for the coupled SPP modes was found to be sensitive to the thickness of each film, which could be interpreted qualitatively by the electron energy-loss probability calculated for thin aluminum (Al) films and narrow Al gaps using Kröger’s formula. It was demonstrated that significant differences in the excitation probability for SPPs could be observed depending on the coupling modes.
AB - The coupled surface plasmon-polariton (SPP) modes excited in an Al/SiO2/ Al multilayer structure were analyzed using angle-resolved electron energy-loss spectroscopy (AREELS) with a relativistic electron probe. The dispersion relations for the coupled SPP modes were then directly observed and compared with predicted relations obtained via calculations. Good agreement was noted between the experimental and calculated results. In the multilayer structures, the dispersion relation for the coupled SPP modes was found to be sensitive to the thickness of each film, which could be interpreted qualitatively by the electron energy-loss probability calculated for thin aluminum (Al) films and narrow Al gaps using Kröger’s formula. It was demonstrated that significant differences in the excitation probability for SPPs could be observed depending on the coupling modes.
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U2 - 10.1093/jmicro/dft047
DO - 10.1093/jmicro/dft047
M3 - Article
AN - SCOPUS:84926476860
VL - 63
SP - 85
EP - 93
JO - Microscopy (Oxford, England)
JF - Microscopy (Oxford, England)
SN - 2050-5698
IS - 1
ER -