Dual-mode Raman method to measure thermal transport properties of 2D materials and van der Waals heterostructures

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication9th US-Japan Joint Seminar
Place of PublicationTokyo, Japan
Publication statusPublished - Jul 2 2017

Cite this

Dual-mode Raman method to measure thermal transport properties of 2D materials and van der Waals heterostructures. / Li, Qinyi; Zhang, Xing; Takahashi, Koji.

9th US-Japan Joint Seminar. Tokyo, Japan, 2017.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

@inproceedings{6bbcb19fdfca426a93d2b14d4b155af0,
title = "Dual-mode Raman method to measure thermal transport properties of 2D materials and van der Waals heterostructures",
author = "Qinyi Li and Xing Zhang and Koji Takahashi",
year = "2017",
month = "7",
day = "2",
language = "English",
booktitle = "9th US-Japan Joint Seminar",

}

TY - GEN

T1 - Dual-mode Raman method to measure thermal transport properties of 2D materials and van der Waals heterostructures

AU - Li, Qinyi

AU - Zhang, Xing

AU - Takahashi, Koji

PY - 2017/7/2

Y1 - 2017/7/2

M3 - Conference contribution

BT - 9th US-Japan Joint Seminar

CY - Tokyo, Japan

ER -