Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface

Hitoshi Kato, Susumu Takemura, Atsuro Ishii, Yoshiyuki Takarai, Yohei Watanabe, Takeharu Sugiyama, Tomoyasu Hiramatsu, Noriyuki Nanba, Osamu Nishikawa, Masahiro Taniguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A nanoscale linked-crater structure was fabricated on an Al surface by chemical and electrochemical combination processes. The surface of an Al plate was treated with Semi Clean and was successively processed in anodization in H2SO4. Dynamic force microscopy image (DFM) showed that a linked-crater structure was formed on the Al surface. At the next stage, the authors conducted the thin film growth of conducting polymer polythiophene on the Al surface by an electrochemical method. The electrochemical polymerization on the Al surface was performed in acetonitrile containing thiophene monomer and (Et)4NBF4 as a supporting electrolyte. After being electrochemically processed, the contour image of each crater was still recognized implying that the polymer nanofilm was grown on the nanoscale structured Al surface. The cross section analysis demonstrated that the nanofilm was grown along the linked-crater structure because the contour of each crater became thick. X-ray photoemission spectroscopy measurement also supported the polymer nanofilm growth because C 1s and S 2p lines were detected. Furthermore, copper phthalocyanine (CuPc) molecules are injected into the polymer nanofilm grown on the nanoscale structured Al surface by diffusing method in order to functionalize the nanoscale hybrid material.

Original languageEnglish
Title of host publicationNanoengineering
Subtitle of host publicationFabrication, Properties, Optics, and Devices IV
Volume6645
DOIs
Publication statusPublished - Dec 1 2007
Externally publishedYes
EventNanoengineering: Fabrication, Properties, Optics, and Devices IV - San Diego, CA, United States
Duration: Aug 27 2007Aug 30 2007

Other

OtherNanoengineering: Fabrication, Properties, Optics, and Devices IV
CountryUnited States
CitySan Diego, CA
Period8/27/078/30/07

Fingerprint

Conducting Polymers
X-ray Spectroscopy
Conducting polymers
conducting polymers
Photoelectron spectroscopy
X ray spectroscopy
Polymer films
Microscopy
Thin Films
Microscopic examination
photoelectric emission
craters
microscopy
Thin films
thin films
spectroscopy
x rays
Polymers
polymers
Phthalocyanine

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Kato, H., Takemura, S., Ishii, A., Takarai, Y., Watanabe, Y., Sugiyama, T., ... Taniguchi, M. (2007). Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface. In Nanoengineering: Fabrication, Properties, Optics, and Devices IV (Vol. 6645). [66451Z] https://doi.org/10.1117/12.733602

Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface. / Kato, Hitoshi; Takemura, Susumu; Ishii, Atsuro; Takarai, Yoshiyuki; Watanabe, Yohei; Sugiyama, Takeharu; Hiramatsu, Tomoyasu; Nanba, Noriyuki; Nishikawa, Osamu; Taniguchi, Masahiro.

Nanoengineering: Fabrication, Properties, Optics, and Devices IV. Vol. 6645 2007. 66451Z.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kato, H, Takemura, S, Ishii, A, Takarai, Y, Watanabe, Y, Sugiyama, T, Hiramatsu, T, Nanba, N, Nishikawa, O & Taniguchi, M 2007, Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface. in Nanoengineering: Fabrication, Properties, Optics, and Devices IV. vol. 6645, 66451Z, Nanoengineering: Fabrication, Properties, Optics, and Devices IV, San Diego, CA, United States, 8/27/07. https://doi.org/10.1117/12.733602
Kato H, Takemura S, Ishii A, Takarai Y, Watanabe Y, Sugiyama T et al. Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface. In Nanoengineering: Fabrication, Properties, Optics, and Devices IV. Vol. 6645. 2007. 66451Z https://doi.org/10.1117/12.733602
Kato, Hitoshi ; Takemura, Susumu ; Ishii, Atsuro ; Takarai, Yoshiyuki ; Watanabe, Yohei ; Sugiyama, Takeharu ; Hiramatsu, Tomoyasu ; Nanba, Noriyuki ; Nishikawa, Osamu ; Taniguchi, Masahiro. / Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface. Nanoengineering: Fabrication, Properties, Optics, and Devices IV. Vol. 6645 2007.
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