Abstract
A nanoscale linked-crater structure was fabricated on an Al surface by chemical and electrochemical combination processes. The surface of an Al plate was treated with Semi Clean and was successively processed in anodization in H2SO4. Dynamic force microscopy image (DFM) showed that a linked-crater structure was formed on the Al surface. At the next stage, the authors conducted the thin film growth of conducting polymer polythiophene on the Al surface by an electrochemical method. The electrochemical polymerization on the Al surface was performed in acetonitrile containing thiophene monomer and (Et)4NBF4 as a supporting electrolyte. After being electrochemically processed, the contour image of each crater was still recognized implying that the polymer nanofilm was grown on the nanoscale structured Al surface. The cross section analysis demonstrated that the nanofilm was grown along the linked-crater structure because the contour of each crater became thick. X-ray photoemission spectroscopy measurement also supported the polymer nanofilm growth because C 1s and S 2p lines were detected. Furthermore, copper phthalocyanine (CuPc) molecules are injected into the polymer nanofilm grown on the nanoscale structured Al surface by diffusing method in order to functionalize the nanoscale hybrid material.
| Original language | English |
|---|---|
| Title of host publication | Nanoengineering |
| Subtitle of host publication | Fabrication, Properties, Optics, and Devices IV |
| Volume | 6645 |
| DOIs | |
| Publication status | Published - Dec 1 2007 |
| Externally published | Yes |
| Event | Nanoengineering: Fabrication, Properties, Optics, and Devices IV - San Diego, CA, United States Duration: Aug 27 2007 → Aug 30 2007 |
Other
| Other | Nanoengineering: Fabrication, Properties, Optics, and Devices IV |
|---|---|
| Country | United States |
| City | San Diego, CA |
| Period | 8/27/07 → 8/30/07 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Cite this
Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface. / Kato, Hitoshi; Takemura, Susumu; Ishii, Atsuro; Takarai, Yoshiyuki; Watanabe, Yohei; Sugiyama, Takeharu; Hiramatsu, Tomoyasu; Nanba, Noriyuki; Nishikawa, Osamu; Taniguchi, Masahiro.
Nanoengineering: Fabrication, Properties, Optics, and Devices IV. Vol. 6645 2007. 66451Z.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Dynamic force microscopy and X-ray photoemission spectroscopy studies of conducting polymer thin film on nanoscale structured Al surface
AU - Kato, Hitoshi
AU - Takemura, Susumu
AU - Ishii, Atsuro
AU - Takarai, Yoshiyuki
AU - Watanabe, Yohei
AU - Sugiyama, Takeharu
AU - Hiramatsu, Tomoyasu
AU - Nanba, Noriyuki
AU - Nishikawa, Osamu
AU - Taniguchi, Masahiro
PY - 2007/12/1
Y1 - 2007/12/1
N2 - A nanoscale linked-crater structure was fabricated on an Al surface by chemical and electrochemical combination processes. The surface of an Al plate was treated with Semi Clean and was successively processed in anodization in H2SO4. Dynamic force microscopy image (DFM) showed that a linked-crater structure was formed on the Al surface. At the next stage, the authors conducted the thin film growth of conducting polymer polythiophene on the Al surface by an electrochemical method. The electrochemical polymerization on the Al surface was performed in acetonitrile containing thiophene monomer and (Et)4NBF4 as a supporting electrolyte. After being electrochemically processed, the contour image of each crater was still recognized implying that the polymer nanofilm was grown on the nanoscale structured Al surface. The cross section analysis demonstrated that the nanofilm was grown along the linked-crater structure because the contour of each crater became thick. X-ray photoemission spectroscopy measurement also supported the polymer nanofilm growth because C 1s and S 2p lines were detected. Furthermore, copper phthalocyanine (CuPc) molecules are injected into the polymer nanofilm grown on the nanoscale structured Al surface by diffusing method in order to functionalize the nanoscale hybrid material.
AB - A nanoscale linked-crater structure was fabricated on an Al surface by chemical and electrochemical combination processes. The surface of an Al plate was treated with Semi Clean and was successively processed in anodization in H2SO4. Dynamic force microscopy image (DFM) showed that a linked-crater structure was formed on the Al surface. At the next stage, the authors conducted the thin film growth of conducting polymer polythiophene on the Al surface by an electrochemical method. The electrochemical polymerization on the Al surface was performed in acetonitrile containing thiophene monomer and (Et)4NBF4 as a supporting electrolyte. After being electrochemically processed, the contour image of each crater was still recognized implying that the polymer nanofilm was grown on the nanoscale structured Al surface. The cross section analysis demonstrated that the nanofilm was grown along the linked-crater structure because the contour of each crater became thick. X-ray photoemission spectroscopy measurement also supported the polymer nanofilm growth because C 1s and S 2p lines were detected. Furthermore, copper phthalocyanine (CuPc) molecules are injected into the polymer nanofilm grown on the nanoscale structured Al surface by diffusing method in order to functionalize the nanoscale hybrid material.
UR - http://www.scopus.com/inward/record.url?scp=42149187865&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=42149187865&partnerID=8YFLogxK
U2 - 10.1117/12.733602
DO - 10.1117/12.733602
M3 - Conference contribution
SN - 9780819467935
VL - 6645
BT - Nanoengineering
ER -