Dynamic observation of dislocation movement across twin boundaries in the lamellar structure of TiAl intermetallic compound

T. Hanamura, R. Uemori, M. Tanino, H. Morikawa

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1 Citation (Scopus)

Abstract

Mechanisms of enhancement of plastic deformation in TiAl responsible for ductility improvement of this material, have been studied by high-voltage electron microscopy (HVEM) and atom probe field ion microscopy (AP-FIM). During cross-twinning, a dislocation interaction occurs at twin boundaries. Dislocation networks and fine Ti3Al particles on the pre-existing twin boundaries promote the formation and movement of twinning partial dislocations, contributing to an improvement of ductility.

Original languageEnglish
Pages (from-to)86-91
Number of pages6
JournalUltramicroscopy
Volume39
Issue number1-4
DOIs
Publication statusPublished - Nov 2 1991
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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