Effect of buffer layer structure on drain leakage current and current collapse phenomena in high-voltage GaN-HEMTs

Wataru Saito, Takao Noda, Masahiko Kuraguchi, Yoshiharu Takada, Kunio Tsuda, Yasunobu Saito, Ichiro Omura, Masakazu Yamaguchi

Research output: Contribution to journalArticlepeer-review

36 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds