Effect of extinction on neutron diffraction intensity of silicon single crystals

Yuji Soejima, Nobutaka Aomine, Hiroshi Yamada, Tadanori Koga, Atsushi Okazaki

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Anomalous temperature dependence previously observed in the neutron diffraction intensity of silicon single crystals has been re-examined. Single-crystal specimens in a special form are used in order to separate intensity contributions from two regions, with and without stresses. It is found that a stressed crystal shows an intensity increase with a broad peak around 200 K, while a stress-free one shows no anomaly.

Original languageEnglish
Pages (from-to)5107-5108
Number of pages2
JournalJapanese Journal of Applied Physics
Volume33
Issue number9 R
DOIs
Publication statusPublished - Sep 1994

Fingerprint

Neutron diffraction
neutron diffraction
extinction
Single crystals
Silicon
single crystals
silicon
Crystals
anomalies
temperature dependence
Temperature
crystals

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Effect of extinction on neutron diffraction intensity of silicon single crystals. / Soejima, Yuji; Aomine, Nobutaka; Yamada, Hiroshi; Koga, Tadanori; Okazaki, Atsushi.

In: Japanese Journal of Applied Physics, Vol. 33, No. 9 R, 09.1994, p. 5107-5108.

Research output: Contribution to journalArticle

Soejima, Yuji ; Aomine, Nobutaka ; Yamada, Hiroshi ; Koga, Tadanori ; Okazaki, Atsushi. / Effect of extinction on neutron diffraction intensity of silicon single crystals. In: Japanese Journal of Applied Physics. 1994 ; Vol. 33, No. 9 R. pp. 5107-5108.
@article{d3b9a3e6bb3e474d959ac0c8d8407b00,
title = "Effect of extinction on neutron diffraction intensity of silicon single crystals",
abstract = "Anomalous temperature dependence previously observed in the neutron diffraction intensity of silicon single crystals has been re-examined. Single-crystal specimens in a special form are used in order to separate intensity contributions from two regions, with and without stresses. It is found that a stressed crystal shows an intensity increase with a broad peak around 200 K, while a stress-free one shows no anomaly.",
author = "Yuji Soejima and Nobutaka Aomine and Hiroshi Yamada and Tadanori Koga and Atsushi Okazaki",
year = "1994",
month = "9",
doi = "10.1143/JJAP.33.5107",
language = "English",
volume = "33",
pages = "5107--5108",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Institute of Physics",
number = "9 R",

}

TY - JOUR

T1 - Effect of extinction on neutron diffraction intensity of silicon single crystals

AU - Soejima, Yuji

AU - Aomine, Nobutaka

AU - Yamada, Hiroshi

AU - Koga, Tadanori

AU - Okazaki, Atsushi

PY - 1994/9

Y1 - 1994/9

N2 - Anomalous temperature dependence previously observed in the neutron diffraction intensity of silicon single crystals has been re-examined. Single-crystal specimens in a special form are used in order to separate intensity contributions from two regions, with and without stresses. It is found that a stressed crystal shows an intensity increase with a broad peak around 200 K, while a stress-free one shows no anomaly.

AB - Anomalous temperature dependence previously observed in the neutron diffraction intensity of silicon single crystals has been re-examined. Single-crystal specimens in a special form are used in order to separate intensity contributions from two regions, with and without stresses. It is found that a stressed crystal shows an intensity increase with a broad peak around 200 K, while a stress-free one shows no anomaly.

UR - http://www.scopus.com/inward/record.url?scp=0028510857&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028510857&partnerID=8YFLogxK

U2 - 10.1143/JJAP.33.5107

DO - 10.1143/JJAP.33.5107

M3 - Article

AN - SCOPUS:0028510857

VL - 33

SP - 5107

EP - 5108

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 9 R

ER -